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Method for process analysis and design optimization based on defect probability

A defect probability and optimized design technology, applied in calculation, special data processing applications, instruments, etc., can solve problems such as the difficulty in establishing the quantitative relationship between process parameters and product reliability, and the inconsistency of the concept and connotation of process reliability. Strong practical value, simple and feasible method

Inactive Publication Date: 2014-01-22
中国兵器科学研究院
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Problems solved by technology

[0003] When explaining the relationship between product reliability and process design in China, the term "process reliability" is often used, but the concept and connotation of process reliability are not consistent, and it is difficult to establish the relationship between process parameters and product reliability. Quantitative relationship

Method used

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  • Method for process analysis and design optimization based on defect probability
  • Method for process analysis and design optimization based on defect probability
  • Method for process analysis and design optimization based on defect probability

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Embodiment Construction

[0016] The flow chart of the present invention is as figure 1 shown, including the following steps:

[0017] 1 Manufacturing process defect analysis and influencing parameter screening.

[0018] According to the characteristics of a certain manufacturing process and its process defects, identify the characterization parameters of process defects, consider the influencing parameters of the manufacturing process from the three aspects of blank size, blank material, and process parameters as much as possible, and use the factor screening method to conduct a preliminary screening of these influencing parameters , the important parameters that affect the formation of defects obtained after the primary screening are used as the input of the second and third steps.

[0019] (1) Identification of process defect characterization parameters. Defining process design defects in a broad sense can include three situations: the product design requirements are not met, the expected technica...

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Abstract

The invention provides a quantitative method for conducting reliability analysis evaluation and reliability optimization in a process design stage. Through reliability analysis evaluation, advantages and disadvantages of different process schemes can be compared, the manufacturing risks are evaluated, and important parameters influencing a manufacturing result can be found out; more reliable parameter optimal values can be obtained through reliability design optimization. The method mainly comprises the 5 steps that manufacturing process defects are analyzed and the influencing parameters are screened; the indeterminacy of the manufacturing process is identified; process reliability analysis and manufacturing risk evaluation are conducted on the basis of an approximate model; process optimization modeling is conducted on the basis of the reliability; a solution to a process reliability optimization model is obtained.

Description

technical field [0001] The invention provides a process analysis method with defect probability as an evaluation parameter, and a process optimization design method with the goal of minimizing the defect probability and constrained by the allowable value of the defect probability, belonging to the field of process design and reliability design analysis. Background technique [0002] With the continuous development of my country's manufacturing industry, the wide application of new materials and new processes has put forward higher requirements for process design capabilities. Conventional process design generally regards various parameters of the manufacturing process as deterministic variables, such as welding current 90A, blank holder force 600N and other process parameters, or even if it is recognized that certain parameters have uncertainties, it is difficult to consider this in process design. The impact of uncertainty on manufacturing results, such as the impact of unc...

Claims

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Application Information

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IPC IPC(8): G06F17/50
Inventor 张纬静姬广振赵丹李娟刘英李阳涂宏茂刘勤钱云鹏杨春华
Owner 中国兵器科学研究院
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