Semiconductor light source bar cooling system and cooling method in aging tests

Abstract

The invention discloses a semiconductor light source bar cooling system in aging tests. The cooling system comprises: a fixture for clamping a semiconductor light source bar, wherein the fixture comprises a housing, and the housing is provided with a water inlet channel and a water outlet channel which are communicated to each other; a first water tank which is connected with the water inlet channel, wherein cooling liquid is contained in the water tank; a second water tank which is connected with the water outlet channel; and a suction device which is connected with the water outlet channel, wherein the suction device is used to suck the cooling liquid in the first water tank to the second water tank at least so as to wash the bottom portion of the semiconductor light source bar to reduce the temperature of the semiconductor light source bar. According to the invention, the heat generated by the semiconductor light source bar in the aging test process can be dissipated, and the advantage of local temperature uniformity can be realized, so the temperature required in the aging tests can be maintained and the heat stability of a HAMR head can be improved. The invention also discloses a corresponding cooling method.

Description

technical field [0001] The present invention relates to a cooling system and a cooling method for a semiconductor light source bar in an aging test, in particular to a cooling system and a cooling method for a laser diode bar used in a heat assisted magnetic recording (HAMR) device in an aging test . Background technique [0002] A disk drive unit is a common information storage device. Figure 1a is a schematic diagram of a typical disk drive unit 100 . It includes a series of rotatable disks 101 mounted on a spindle motor 102 , and a head stack assembly (HSA) 130 . The HSA 130 includes at least one motor arm 104 and an HGA 150 . Typically, a voice-coil motor (spindling voice-coil motor, VCM) (not shown) is provided to control the movement of the motor arm 104 . [0003] refer to Figure 1b , the HGA 150 includes a magnetic head 103 having a HAMR head (not shown in the figure) and a suspension member 190 supporting the magnetic head 103 . The cantilever 190 includes a ...

AI Technical Summary

Problems solved by technology

However, this method will bring about the problem of uneven temperature

Due to the local heat generated on the semiconductor light source bar and accumulated in it during the burn-in test, the temperature in the semiconductor light source bar is uneven and the heat cannot be dissipated properly

When the local temperature of a semiconductor light source bar, such as a laser diode, increases, on the one hand, the conversion efficiency from electrical input to optical output decreases, so for a fixed electrical input, its laser output decreases; on the other hand, due to the laser The local temperature rise of the diode may exceed the temperature required for the burn-in test, thereby affecting or destroying the test results of the laser diode, thereby affecting the performance of the HAMR head

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