Product parametric yield estimation method

Abstract

The invention discloses a product parametric yield estimation method, which specifically comprises the steps of 1) obtaining estimation samples; 2) checking whether the estimation samples is in a state of one-sided truncated normal distribution or not and abandoning samples which are not in the state of one-sided truncated normal distribution; 3) obtaining the average value of the samples; 4) obtaining the standard deviation of the samples; 5) substituting the average value and the standard deviation of the samples into a process capability index formula to obtain process capability indexes; 6) checking the process capability indexes, wherein for the estimation samples with the process capability indexes which are not within an applicable interval, the specific parametric yield cannot be estimated; and 7) substituting the process capability indexes into a parametric yield and process capability index model to obtain the parametric yield. The product parametric yield estimation method disclosed by the invention can be used for estimating the parametric yield of performance testing data which is subject to truncation processing, and has the characteristics that the process is simple, the calculation is simple and convenient to perform and the practical value is high.

Description

technical field [0001] The technology belongs to the field of microelectronic technology, and further relates to a method for estimating the yield rate of product parameters in the field of quality and reliability evaluation of electronic components. The invention can be used to directly calculate the parameter yield under the condition of obtaining the data provided by the supplier or the tester. Background technique [0002] The yield rate of electronic component parameters refers to the ratio of the number of products whose characteristic parameters meet the specification requirements to the total number of manufactured products after the product is designed and manufactured. Parameter yield is an important performance of component quality and reliability, and there is a clear correlation between parameter yield, quality and reliability. The more unqualified components appear in the inspection process, that is, the lower the parameter yield, the lower the quality and rel...

AI Technical Summary

Problems solved by technology

The shortcomings of this method are: first, the circuit needs to be tested several times to obtain the data used for fitting the model; second, the process value that is most likely to cause integrated circuit failure is not easy to obtain; third, the yield estimation process is very difficult. complex and difficult to operate

The shortcomings of this method are: first, it is difficult to obtain the effective area curve of each layer of power failure and leakage in the product layout; second, the process of yield estimation is very complicated

[0007] When it is necessary to estimate the yield of its parameters based on the performance test data of the product, none of the above methods can be used

At this time, the distribution parameters can only be estimated based on the data samples to estimate the yield

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