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Spectrum measurement system

A technology of spectrum measurement and measuring instrument, which is applied in the field of spectrum measurement system for measuring optical signals to be measured, can solve the problems of high purchase cost and unfavorable research by laboratory researchers, and achieve the effect of reducing production cost and improving accuracy

Inactive Publication Date: 2013-12-04
UNIV OF SHANGHAI FOR SCI & TECH
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Problems solved by technology

However, most of the spectral measurement systems currently on the market are highly integrated, that is, the components of the measurement system are refined and combined, which is not conducive to the research of laboratory researchers.
Furthermore, for the integrated spectral measurement system, its high purchase cost is not a good choice for the research and development of the laboratory. Therefore, it is very important to design a cheap, simple and practical optical system. And it's an inevitable choice

Method used

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Embodiment Construction

[0011] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0012] figure 1 It is a schematic diagram of the light spectrum measurement system in the embodiment of the present invention; as figure 1 As shown, a spectral measurement system for measuring optical signals to be measured, which is composed of basic measuring instruments in the laboratory, has a light source to be measured 1, an optical chopper device 2, a monochromator 3, a chopper control device 4, Detector 5, lock-in amplifier 6, data acquisition card 7, computer 8. Synchronous control software 9 and curve processing software 10 are installed in the computer.

[0013] First, the light source 1 to be tested sends out a light signal to be tested. Next, the optical chopper device 2 converts the optical signal to be measured into a periodic alternating optical signal, and the chopper control device 4 controls the chopping of the optical c...

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Abstract

A spectrum measurement system which is formed by basic measurement instruments in laboratories and is used for measuring optical signals to be measured is provided. The spectrum measurement system includes the following components of: an optical chopper which converts the optical signals to be measured into periodic alternatively-changed optical signals; a monochromator divides the alternatively-changed optical signals into monochromatic a series of optical signals in different wave bands of which the set is the total wave band in which the optical signals to be measured are; a detector which continuously detects the monochromatic optical signals in different wave bands and converts the monochromatic optical signals into different electrical signals with corresponding intensities and in corresponding wave bands; a phase-locked amplifier which amplifies the electrical signals; a data acquisition card which acquires and transmits the electrical signals which have been amplified by the signal phase-locked amplifier; and a curve processing module which is mounted in a computer, and converts the electrical signals transmitted by the data acquisition card into corresponding voltage strengths, and obtains light intensities of corresponding wave bands according to the direct proportion relations between the voltage strengths and the light intensities of the optical signals to be measured so as to draw a wave spectrum curve diagram in the total wave band in which the optical signals to be measured are.

Description

technical field [0001] The invention relates to a spectrum measurement system, in particular to a spectrum measurement system for measuring optical signals to be measured which is composed of laboratory basic measuring instruments. Background technique [0002] The spectral measurement system is a measurement system that is composed of spectrometer as the center and other detection equipment. There are many types of spectrometers, in addition to spectrometers used in the visible light band, there are infrared spectrometers and ultraviolet spectrometers. At present, with the development of lighting technology and semiconductor technology, the research on the spectral characteristics of various light-emitting devices and materials has very important uses, and various systems for measuring spectra have been produced accordingly, and there are many high-value measurement systems. However, these measuring systems are mainly prepared for accurate measurements. Because of the str...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28
Inventor 张文君翟保才董洪波许键
Owner UNIV OF SHANGHAI FOR SCI & TECH
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