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Nanoparticle diameter measuring device and nanoparticle diameter measuring method

A nanoparticle diameter and nanoparticle technology, which is applied in the field of nanoparticle diameter measuring devices, can solve the problems of inability to directly measure high-concentration nanoparticles and low detection accuracy, and achieve the effects of low cost and simple operation.

Inactive Publication Date: 2016-01-20
UNIV OF SHANGHAI FOR SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The current standard measurement method for nanoparticles is the dynamic light scattering (Dynamic Light Scattering, DLS) measurement method, which uses a photomultiplier tube for detection. Because the photomultiplier tube is a single-point detection, it can only be used for the measurement of nanoparticles in dilute solutions. Impossible to directly measure high concentrations of nanoparticles
[0004] In addition, dynamic light scattering is a direction finding scattering detection, which is easily affected by multiple scattering, so the detection accuracy is not high

Method used

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Embodiment

[0028] figure 1 It is a schematic diagram of a nanoparticle diameter measuring device according to an embodiment of the present invention.

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Abstract

The present invention relates to a nanometer particle diameter measuring device for measuring the diameters of the nanometer particles and a nanometer particle diameter measuring method. The nanometer particle diameter measuring device comprises a light source, a concave lens, a sample cell, an aperture component, an optical filter, a transforming part and a calculating part. The laser emitted by the light source changes into the scattered light after passing the sample cell, the transforming part carries out imaging and detection on the scattered light, and the calculating part obtains the diameters of the nanometer particles in the sample cell via an image contrast analysis method. The transforming part can realize the multipoint detection, and the measuring mode is the backward measurement and is not influenced by the multiple-scattering easily, so that the diameters of the high-concentration nanometer particles can be detected directly, the problem that a conventional dynamic light scattering measuring device can not measure directly at a high concentration is solved, and the nanometer particle diameter measuring device has the advantages of low cost and simple operation.

Description

technical field [0001] The invention relates to a nanoparticle diameter measuring device for measuring the diameter of nanoparticle and a method for measuring the nanoparticle diameter by using the nanoparticle diameter measuring device. Background technique [0002] Nanoparticles have broad application prospects in catalysis, light filtering, light absorption, medicine, magnetic media and new materials due to their unique properties of light, magnetism, electricity, heat and catalysis. The size of nanoparticles directly affects its various properties, so the measurement technology of nanoparticles is a necessary condition for the development of nanotechnology. [0003] The current standard measurement method for nanoparticles is the dynamic light scattering (Dynamic Light Scattering, DLS) measurement method, which uses a photomultiplier tube for detection. Because the photomultiplier tube is a single-point detection, it can only be used for the measurement of nanoparticles ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/08B82Y35/00
Inventor 杨晖杨海马孔平郑刚于小强宋磊磊
Owner UNIV OF SHANGHAI FOR SCI & TECH
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