Extreme ultraviolet attosecond pulse width measurement method and device

A metrology method, extreme ultraviolet technology, applied in the field of optics, which can solve problems such as no longer applicable, failure, bottleneck of improving time resolution, etc.

Inactive Publication Date: 2013-11-13
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

Since there is no effective nonlinear medium in this waveband, the commonly used pulse measurement methods based on nonlinear optical effects, such as FROG (Frequency-Resolved Optical Gating), are no longer applicable.
For the commonly used method of characterizing X-ray pulses whose pulse width is greater than the period of the background laser field, this method cannot be directly extended to attosecond-level pulses due to the attosecond-level pulse width of the X-ray pulse to be measured. representation of
In the process of exploring the attosecond pulse characterization method, people have also tried to use the traditional variable image tube streak camera technology, but because this technology has a bottleneck in the improvement of time resolution determined by its working principle, this idea also ultimately failed

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  • Extreme ultraviolet attosecond pulse width measurement method and device
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  • Extreme ultraviolet attosecond pulse width measurement method and device

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Embodiment Construction

[0020] see Figure 1-3 , the technical device of the present invention is as figure 1 The pump-probe configuration shown is based on the Mach-Zehnder interferometer structure (this is a well-known structure in physics). The carrier-envelopment phase-locked sparse-period ultra-intensive near-infrared femtosecond optical pulse is used as the driving light source of the whole system. This pulsed light source generates an extreme ultraviolet single attosecond pulse through a strong-field high-order harmonic process in one arm of the interferometer; Finally, the single attosecond pulse and the near-infrared pulse from the other arm of the interferometer propagate collinearly in the vacuum system at the same time, and act as pump light and probe light respectively at the target medium to undergo a two-color field ionization process with the medium atoms. The extreme ultraviolet attosecond light pulse ionizes the target atom through single-photon ionization. Under the condition that...

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Abstract

The invention relates to an extreme ultraviolet attosecond pulse width measurement method and device. The method comprises the following steps: 1, adjusting double arms of a Mach-Zehnder interferometer so as to realize collinear transmission of superstrong femtosecond pulses locked by extreme ultraviolet attosecond pulses to be detected and carrier envelope phases; 2, focusing two optical fields on the same spacial point of a target; 3, adjusting relative time delay of pumping light and probe light to obtain a two-dimensional photoelectron energy spectra; 4, reestablishing a time-domain outline of the extreme ultraviolet attosecond pulses to be detected by using a frequently-used iteration algorithm in FROG (Frequency-Resolved Optical Gating) to obtain pulse width. The method and device provided by the invention can be used for detecting the attosecond pulses, and also can be used in the application research of the attosecond pulses and the extreme ultraviolet attosecond pulse width.

Description

technical field [0001] The invention belongs to the field of optics and relates to an ultrafast diagnosis technology, in particular to a method and device for measuring the pulse width of extreme ultraviolet attosecond pulses. Background technique [0002] Ultrafast phenomena (duration less than 1 μs) widely appear in nature or related scientific and technological research. For example, the photosynthesis process of plants, the relaxation process of photoexcited states in optical materials, the molecular dynamics process of chemical reactions, the fluorescence emission of biological materials, the physical process of interaction between strong light and matter, and other time scales are mostly in picoseconds to femtoseconds magnitude, even in the range of attosecond magnitude. Therefore, the study of ultrafast phenomena has a huge impetus and important practical significance for the development of natural science research such as materials, biology, photophysics, and photoc...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
Inventor 王超赵卫田进寿王兴白永林
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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