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Chip Thermal Analysis Method Based on 3D Domain Decomposition

A three-dimensional area and thermal analysis technology, which is applied in the fields of instruments, calculations, and electrical digital data processing, can solve problems such as chip errors, the efficiency of chip thermal analysis methods needs to be improved, and the calculation time of chip systems increases.

Inactive Publication Date: 2016-04-27
TSINGHUA UNIV
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  • Application Information

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Problems solved by technology

Studies have shown that if the thermal analysis of the chip is not considered or approximated to simplify its geometry, the results of thermal analysis of the chip may cause an error of more than 10 °C
[0004] Since the size of heat dissipation components such as heat sinks is much larger than the size of the integrated circuit chip, the calculation time for the overall thermal analysis of the chip system will be greatly increased, and some fast algorithms cannot be applied to this thermal analysis problem involving multiple areas of different sizes
Therefore, the efficiency of chip thermal analysis method needs to be improved

Method used

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  • Chip Thermal Analysis Method Based on 3D Domain Decomposition
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  • Chip Thermal Analysis Method Based on 3D Domain Decomposition

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Embodiment Construction

[0017] refer to figure 1 As shown, it is a schematic diagram of the application environment of a preferred embodiment of the chip thermal analysis method based on three-dimensional area decomposition of the present invention. The chip thermal analysis method based on three-dimensional domain decomposition is applied to the computing device 1 . The computing device 1 includes a chip thermal analysis program 10 , a storage device 11 and a processor 12 . The storage device 11 stores program codes of the chip thermal analysis program 10 and data required during operation. The processor 12 executes the program code of the chip thermal analysis program 10 to implement the chip thermal analysis method based on three-dimensional area decomposition, and calculate the temperature distribution of the chip in the chip system. The chip system includes a chip and k heat dissipation components (k≥1). The heat dissipation components include, but are not limited to, heat spreaders and heat ...

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Abstract

A chip thermal analysis method based on three-dimensional domain decomposition comprises the steps of adopting a non-overlapping domain decomposition method to perform thermal analysis of a chip system including a chip and a heat-radiating part, performing discrete grid division of different domains of the chip system respectively, setting an appropriate condition at each domain interface position to solve the domains and achieving convergence of a computed result of the interface position of the chip and the heat-radiating part through multiple overall iterations. By means of the chip thermal analysis method based on the three-dimensional domain decomposition, temperature distribution of the chip in the chip system can be quickly calculated.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit physical verification and analysis, and in particular relates to a method for accurately calculating chip temperature distribution. Background technique [0002] With the development of integrated circuits, more and more devices are included in the integrated circuits, and the power consumption per unit area shows an increasing trend. Therefore, the problem of heat generation of integrated circuits has become increasingly prominent. In order not to affect the normal operation and reliability of the circuit, it is necessary to equip the chip in the integrated circuit with an effective heat dissipation component (such as a heat spreader, a heat sink), and the chip and the heat dissipation component together form a heat conduction system. [0003] In the integrated circuit design process, in order to ensure the performance of the final chip, it is necessary to conduct chip thermal analysi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
Inventor 喻文健章涛
Owner TSINGHUA UNIV
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