Image force microscopy of molecular resonance

An atomic force microscope, molecular technology, applied in scanning probe microscopy, manipulation of single atoms, instruments, etc., can solve the problem of spectral identification without the use of detection materials

Active Publication Date: 2013-09-11
RGT UNIV OF CALIFORNIA
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Problems solved by technology

However, in addition to the Magnetic Resonance Force Microscope (MRFM) which has been used to detect NMR at mK temperature, the AFM based scanning force microscope (AFM based scanning force microscope) has been widely used to study the properties of materials at the nanoscale , without utilizing the spectral identification of the detection material (spectroscopic identification)

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  • Image force microscopy of molecular resonance
  • Image force microscopy of molecular resonance
  • Image force microscopy of molecular resonance

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Embodiment Construction

[0026] The cantilever provides the 1st mechanical resonance f 0 ( figure 1 ) in the gravitational mode (attractive mode) AFM of vibration 7 microscope. f 0 Changes in the oscillation amplitude detect the van der Waal (van der Waal) gravitational force between the tip and the object, and can also use and obtain topography feedback signals. In the traditional tapping (tapping) mode AFM, the AFM detector is firmly on the object. Using a stiffness constant with k=3n / m and f 0 = 65KHz of the 1st mechanical resonance of the cantilever. choose f m f = 360KHz laser modulation frequency is detected 0 +f m The frequency in the upper sideband is 425KHz.

[0027] Different from traditional methods, in changing the frequency f of the force gradient between object features m Excitation / laser beam (energy source) in and changing f m mirror image in . This force gradient modulation follows from f 0 +f m and f 0 -f m Frequency-sequential modulation of cantilever mechanical reso...

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Abstract

A new method in microscopy is provided which extends the domain of AFM's to nanoscale spectroscopy. Molecular resonance of nanometer features can be detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven molecular dipole / multipole and its mirror image in a Platinum coated scanning probe tip. The method is extendable to obtain nanoscale spectroscopic information ranging from infrared to UV and RF.

Description

technical field [0001] Cross-references to related patents [0002] This patent claims the benefit of US Patent Application Serial No. 61 / 401,495 filed August 13, 2010, the entire contents of which are incorporated herein by reference. field of invention [0003] The present invention relates to microscopy, in particular, the present invention relates to the utilization of atomic force microscopy for nanoscale spectroscopic analysis. [0004] government support [0005] This invention was made with government support under Grant Nos. HG004431 and HG004549 awarded by the National Institutes of Health, and the United States Government has certain rights in this invention. Background technique [0006] Atomic Force Microscopy (AFM) has been successfully applied to surfaces with chemical 1 magnetic 2,3 And electrostatic (electrostatic) 4,5 Nanoscale imaging of properties. These microscopes rely on the probe tip (commonly silicon) to change appropriately to detect a speci...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/24B82B1/00
CPCG01Q30/02G01Q60/34G01Q60/40B82B1/00G01Q60/24G01Q60/38
Inventor H·库马尔·维克拉马辛赫英德拉吉斯·拉贾帕克萨
Owner RGT UNIV OF CALIFORNIA
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