Position detection apparatus, imprint apparatus, and method for manufacturing device
A detection device and detection method technology, applied in the direction of measuring devices, nanotechnology for information processing, optical devices, etc., can solve the problems of measurement accuracy degradation and achieve the effect of improving detection accuracy
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[0021] Various exemplary embodiments, features, and aspects of the invention will be described in detail below with reference to the accompanying drawings.
[0022] First, refer to Figure 1A , Figure 1B and Figure 1C as well as Figure 2A , Figure 2B , Figure 2C and Figure 2D A first exemplary embodiment of the present invention will be described. Figure 1A , Figure 1B and Figure 1C is a diagram showing the configuration of the position detection device 100 according to the first exemplary embodiment, and shows an example in which the present invention is applied to an alignment detection device of an imprint device. In the present exemplary embodiment described below, a position detection device and a position detection method for acquiring relative positions by using a mold and a wafer as two different objects will be described.
[0023] will refer to Figure 1A The configuration of the position detection device 100 will be described. Light emitted from a li...
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