Constant width film stretching device combined with X-ray scattering, and experimental method thereof

Abstract

The invention provides a constant width film stretching device combined with X-ray scattering, and an experimental method thereof. The device employs two Yaskawa servo motors to drive a ball screw to stretch a sample. The rotation of the motors is controlled by a Labview software. One end of the device is configured to a tension sensor for tracking tension change during a stretching process. During the stretching process, scissor mechanism fixtures are employed perpendicular to the stretching direction, so as to guarantee that the width of the sample can be kept constant during the stretching process and chuck points move uniformly along with the sample. The device employs a forced nitrogen stream to equalize temperature distribution in a sample cabin and reduce thermal degradation of the sample at a high temperature. Two temperature monitoring points are pre-set in the sample cabin. The temperature is precisely controlled by the temperature controller. The device has the advantages of easy disassembly and assembly and the like, is very suitable for combination with synchrotron radiation line stations, and is a very good device for studying the relationship between a structural evolution behavior and the film properties in film stretching and processing.

Description

technical field [0001] The present invention relates to a technique for studying the relationship between the structural evolution of polymer films and external field parameters by using synchrotron radiation X-ray scattering, in particular to a constant width film stretching device and its experimental method combined with X-ray scattering, capable of studying different film samples Structural evolution behavior under different stretching temperatures, different stretching rates and stretching ratios. Coupling the crystallinity and orientation degree of the thin film sample obtained by X-ray scattering with the tensile mechanical data can obtain the relationship between the external field parameters and the structural properties of the thin film. It is used in the laboratory to simulate the actual film stretching processing conditions and reveal the scientific problems of film industrial processing. Background technique [0002] In the stretching process of polymer film, w...

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Problems solved by technology

[0003] Although there have been a lot of accumulations on flow field-induced crystallization, most of them use shear flow field, and there are relatively few studies on extensional flow, and the in-situ study on crystallization induced by constant width extensional flow field has not been reported so far.

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