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Ultrafast lens-free coherent electron diffraction imaging method and device

A technology of electron diffraction and imaging method, applied in circuits, discharge tubes, electrical components, etc., can solve the problems of limited time and space resolution, no high time resolution ability, etc., to achieve the effect of simple structure and cost reduction

Inactive Publication Date: 2013-01-30
SHANGHAI JIAO TONG UNIV
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Problems solved by technology

It combines electron pulses precisely synchronized with process excitation sources (such as femtosecond laser pulses) and lens-free coherent diffraction imaging technology to analyze the intensity distribution of diffracted coherent electron pulses, determine the electron scattering phase through inversion calculation, and realize three-dimensional instantaneous Reconstruction of structure and morphology at the atomic scale, solving the technical dilemma that the traditional electron microscopy imaging method does not have high time resolution or the current ultrafast electron imaging is limited in time and space resolution

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  • Ultrafast lens-free coherent electron diffraction imaging method and device
  • Ultrafast lens-free coherent electron diffraction imaging method and device

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Embodiment Construction

[0038] The present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.

[0039] The ultra-fast lensless coherent electron diffraction imaging method of the present invention has the advantages of simple pulse electronic control system, and the spatial resolution is not restricted by the defocusing objective lens. It only needs a set of strong focusing magnetic lenses to focus the pulse electrons on the sample, without By defocusing the electromagnetic lens, ultra-high time and ultra-high spatial resolution in real space can be realized. This method is very easy to combine with MeV ultrafast electron diffraction, but this method has extremely high requirements on the coherence of the pulsed electron beam. The coherence of the pulsed electron beam and the focused electron spot size determine the spatial resolution of the present invention.

[004...

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Abstract

The invention discloses an ultrafast lens-free coherent electron diffraction imaging method and device. The method is combined with the electronic pulse which is in precise synchronization with process exciting sources (such as femtosecond laser pulses) and a lens-free coherent electron diffraction imaging technology, and comprises the steps of analyzing the strength distribution of the diffracted coherent electronic pulses, and carrying out back calculation to determine the electronic scattering phase, so as to achieve the reconstruction of the structure and the appearance of three-dimensional transient atomic scale. By adopting the method and device disclosed by the invention, the technical problem that the conventional electronic microimaging method has no high time resolution or the existing ultrafast electronic imaging time and space resolution are limited can be solved.

Description

technical field [0001] The present invention relates to time-resolved electron microscopy imaging, in particular to an ultrafast lensless coherent electron diffraction imaging method with a temporal resolution better than 1 picosecond and a spatial resolution better than 1 nanometer and a possible corresponding device. Background technique [0002] The background technology involved in the present invention is divided into two aspects; [0003] 1. The temporal and spatial resolution of the electron microscope: The traditional electron microscopic imaging has three main directions: increasing the electron accelerating voltage, using an electromagnetic lens, and improving the quality of the electron source, and its spatial resolution has been improved to the limit. Since traditional electron microscopic imaging is generally time-accumulated topography imaging, it is impossible to perform high-time-resolved imaging of processes in various fields such as physics, chemistry, and ...

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Application Information

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IPC IPC(8): H01J37/26H01J37/295
Inventor 陈洁王西杰陈明伟朱溢眉朱鹏飞
Owner SHANGHAI JIAO TONG UNIV
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