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High-accuracy optical imaging device and method based on quantum statistics

A technology of optical imaging and quantum statistics, which is applied in the fields of optical imaging and optical detection, and can solve problems such as the limitation of the optical properties of the detection light and the inability to achieve resolution

Inactive Publication Date: 2013-01-30
UNIV OF SCI & TECH OF CHINA
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is that the current optical imaging method is limited by the optical properties of the probe light and cannot achieve a resolution below 100 nanometers

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  • High-accuracy optical imaging device and method based on quantum statistics
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Embodiment Construction

[0029] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0030] The invention collects the fluorescence of the object to be imaged through a fluorescence microscope, and the fluorescence signal is connected to a photon counting and statistical system for processing, and high-order light intensity information can be obtained by using the quantum statistical characteristics of photons, and a high-resolution image can be reconstructed by using a suitable algorithm. The recognition and resolution of more luminescent objects can be achieved by measuring higher-order photon coincidence counting methods.

[0031] The invention can be applied to the imaging of objects with multiple luminous points, measures high-order photons, divides fluorescence signals into multiple paths according t...

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Abstract

The invention discloses a high-accuracy optical imaging device based on quantum statistics. The high-accuracy optical imaging device comprises a laser confocal microscopic device (1), a single-photon counting statistical unit (2) and a master control device (3), wherein the laser confocal microscopic device (1) is used for stimulating a sample, collecting fluorescence emitted by the sample and guiding the fluorescence into the single-photon counting statistical unit (2); the single-photon counting statistical unit (2) is used for receiving a fluorescence signal from the laser confocal microscopic device (1), generating a plurality of single-photon counting signals and multiphoton coincidence counting signals and outputting the plurality of single-photon counting signals and the multiphoton coincidence counting signals to the master control device (3); and the master control device (3) is respectively connected with the laser confocal microscopic device (1) and the single-photon counting statistical unit (2) and used for generating control signals and respectively outputting the control signals to the laser confocal microscopic device (1) and the single-photon counting statistical unit (2) so as to control confocal scanning of the laser confocal microscopic device (1) to be synchronous with data collection of the single-photon counting statistical unit (2). The high-accuracy optical imaging device based on quantum statistics can provide high-accuracy imaging and resolution of adjacent objects, and the accuracy of the high-accuracy optical imaging device based on quantum statistics is not limited by the Rayleigh limit.

Description

technical field [0001] The invention belongs to the technical field of optical imaging and optical detection, and in particular relates to an optical imaging device and method based on quantum statistics. The optical imaging method has high precision breaking through the Rayleigh scattering limit. Background technique [0002] The accuracy with which two objects can be resolved optically is limited by the Rayleigh scattering limit, and its resolving power is related to the wavelength of the light used. If visible light is used as the detection light source, the general resolution accuracy is hundreds of nanometers. However, in various researches and applications at this stage, resolutions with a scale below 100 nanometers are often encountered. In this case, ordinary optical detection methods are powerless. Therefore, a solution is to use various expensive experimental instruments, such as atomic force microscopes, near-field optical scanning microscopes or scanning electr...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B21/36
Inventor 孙方稳崔金明郭光灿
Owner UNIV OF SCI & TECH OF CHINA
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