Idle state test method of system-on-chip (SoC), system and test device

Abstract

The invention is suitable for the embedded technology field and provides an idle state test method of a system-on-chip (SoC), a system and a test device. The method comprises the followings steps: A. Carrying out power-on reset of the SoC and acquiring an identification number from a preset position in a preset random access memory; B. Calculating the identification number of a test case, wherein the test case is the test case of entering into / exiting the idle state of the SoC; C. Determining whether the identification number of the test case is a null character, if the identification number of the test case is the null character, exiting the test of the SoC, and if the identification number of the test case is not the null character, acquiring an address of the test case and executing the test case; after the test is completed, writing the identification number of the test case into the preset position of the preset random access memory and entering into the step A. According to the invention, batch test of the test case of entering into / exiting the idle state of the SoC is realized; test efficiency of a test system is increased and a processing amount of data is reduced.

Description

technical field [0001] The invention belongs to the field of embedded technology, and in particular relates to an idle state testing method, system and testing device of a SoC chip. Background technique [0002] A system-on-chip (SoC, System-on-Chip) is an integrated circuit with a dedicated target, which can be a complete system, such as a microprocessor ARM, an intellectual property core (IP core) and a memory. At the same time, SoC chip is also a general term for a technology, which is used to realize the whole process from determining the system function, to software / hardware division, and to complete the design. [0003] At present, SoC chips have been widely used in various handheld devices, such as digital cameras, smart phones, etc., which requires SoC chips to have low power consumption. In order to reduce the power consumption of SoC chips, more effective methods It is to turn off the power of the temporarily unused modules in the SoC chip, so that the SoC chip en...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the embodiments of the present invention is to provide a SoC chip idle state testing method, system and testing device, aiming to solve the problem that the existing testing method cannot carry out continuous testing of multiple test cases, resulting in an increase in the processing data of the testing system. The problem of reduced test efficiency

Images