Circuitry built-in test device based on boundary scanning mechanism
A technology of boundary scan and circuit system, applied in the direction of electronic circuit test, measuring device, measuring circuit, etc., can solve the problems of weak self-test and diagnosis ability, lack of in-machine self-test means, multi-level structure and composition, etc., to improve The effect of testing diagnostic capabilities, improving overall testing capabilities, and improving testing efficiency
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[0020] The present invention adopts a hierarchically integrated BITE structure, which is composed of subsystem-level BITE, circuit board-level BITE, and component-level BITE. like figure 1 As shown, among them, the subsystem-level BITE is interconnected with the external data management system through the system-level high-speed data bus (such as the 1553B bus), and the next level is connected with the circuit board-level BITE and the circuit board level through the system-level test and maintenance bus (such as the CAN bus). Other circuit boards under test in other subsystems are interconnected, and the circuit board-level BITE is interconnected with the component-level BITE and other components in the circuit board through the boundary scan test bus to the next level.
[0021] Sub-system level BITE consists of five units including test generation, test vector library, fault diagnosis, communication interface 1, and communication interface 2, such as figure 2 shown. The ou...
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