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Device for testing plasma scanning driver ic

A technology of scan driving and chip testing, which is applied in the field of ion scanning driving chip testing devices, can solve the problems of fragile devices, slow test speed, high test cost, etc., and achieve the effects of short time consumption, high reuse rate and reduced test cost

Active Publication Date: 2012-07-04
HANGZHOU SILAN MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is: to solve the technical problems that the current PDP chip test mainly relies on wiring, manual testing, etc., the test speed is slow, the test efficiency is low, the test cost is high, and the device is easy to be damaged

Method used

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  • Device for testing plasma scanning driver ic
  • Device for testing plasma scanning driver ic
  • Device for testing plasma scanning driver ic

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Embodiment Construction

[0057] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0058] The structural representation of the test device embodiment of the present invention is as figure 1 shown. The test device is connected with the PDP chip to be tested, automatically tests the input / output parameters of the PDP chip to be tested, stores and displays the test results. The test device includes: a display terminal, a main processor, a digital logic module, a chip power supply module, a multi-way selection switch and a power pin test module. The main processor connects the chip power supply module through the enable line, controls the chip power supply module to enter the power supply state, and configures the chip power supply module to output working power to the power pins of the PDP chip, that is, the low-voltage logic power supply pin VDL and the high-voltage power supply of the PDP chip Pin VDH.

[0059] The chip power supp...

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PUM

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Abstract

The invention relates to the field of integrated circuit testing, and discloses a device for testing a plasma scanning driver ic, which includes a main processor, a digital logic module, a chip power supply module, a multiway select switch, a power pin test module and a display terminal, and can be used for performing one or more tests for a PDP chip including a quiescent current test, a working current test, a serial shifter functional test, a high-voltage leakage current test, a source current output test, a sink current output test and a high / low voltage input test. The device provided by the invention has the advantages of high testing efficiency, short consumed time and high precision during the test verification process, is high in reuse rate, and has the advantages of simplicity in testing and high coverage rate, has low possibility of damaging the device in case of automatic measurement, and greatly reduces the testing cost.

Description

technical field [0001] The invention belongs to the field of integrated circuit testing, in particular to a plasma scanning driving chip testing device. Background technique [0002] In the test and verification stage, the test and verification of integrated circuits is a complex and cumbersome task that requires patience and care. Guarantee the quality and vitality of integrated circuits. [0003] The test of integrated circuits, especially the plasma scanning driver chip including high-speed digital control, high voltage, high current, multi-channel output and fast curve change, hereinafter referred to as PDP chip (Plasma DisplayPanel, plasma scanning driver chip) test is a complicated task. Work. The PDP chip includes power supply pins (high-voltage power supply pin VDH, low-voltage logic power supply pin VDL), logic control pins (data serial input pin DA, clock signal control pin CLK, operating mode signal control pin OC1, OC2), data serial output pin DB and 96 power ...

Claims

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Application Information

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IPC IPC(8): G01R31/317
Inventor 符强蒋登峰魏建中
Owner HANGZHOU SILAN MICROELECTRONICS
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