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Method and device for measuring refractive index of transparent medium based on Y-shaped-cavity orthogonal polarization laser

A technology of orthogonal polarization and transparent medium, applied in the direction of polarization influence characteristics, etc., can solve the problems of complex instrument structure, heavy operation work, low precision, etc., and achieve the effects of high response speed, high resolution and simple equipment

Inactive Publication Date: 2012-06-20
NAT UNIV OF DEFENSE TECH
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Problems solved by technology

[0003] In order to overcome the shortcomings of the existing methods and devices for measuring the refractive index of transparent media, such as complex instrument structure, heavy operation, difficult adjustment, and low precision, the present invention provides a high-precision transparent media refractive index based on a Y-shaped cavity orthogonally polarized laser. Rate measurement method and device

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  • Method and device for measuring refractive index of transparent medium based on Y-shaped-cavity orthogonal polarization laser
  • Method and device for measuring refractive index of transparent medium based on Y-shaped-cavity orthogonal polarization laser
  • Method and device for measuring refractive index of transparent medium based on Y-shaped-cavity orthogonal polarization laser

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Embodiment Construction

[0024] exist figure 1 Among them, the Y-cavity orthogonally polarized laser 100 includes a piezoelectric ceramic 101, a first high-reflectivity lens 103, a second high-reflectivity lens 104, a third high-reflectivity lens 105, a polarization splitting film 106, and a helium-neon discharge tube 107 , common section 108, S subsection 109 and P subsection 110.

[0025] The common segment 108 and the S sub-segment 109 are processed integrally using glass-ceramic material, and they share one end face. The first high-reflectivity lens 103 is pasted on the first end surface of the common section 108 by optical glue, and the first piezoelectric ceramic 101 is mounted on the first high-reflectivity lens. The second high-reflectivity mirror 104 is pasted on the first end surface of the S subsection 109 by means of optical glue. The second piezoelectric ceramic 102 is installed on the second high reflectivity mirror 104 . The polarization splitting film 106 is plated on the common end...

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Abstract

The invention relates to a method and a device for measuring refractive index of transparent medium based on a Y-shaped-cavity orthogonal polarization laser. The device is composed of a Y-shaped-cavity orthogonal polarization laser, a sample cell, a working point selecting and controlling unit and a signal collecting and processing unit. After the transparent medium is pumped in or pumped out the sample cell, the refractive index of the P sub-segment of the Y-shaped-cavity orthogonal polarization laser can change, therefore the optical length difference of an S sub-cavity and a P sub-cavity changes, the beat frequency difference of S polarized light and P polarized light in the Y-shaped-cavity orthogonal polarization laser also changes, and the change value of the beat frequency difference is proportional to the refractive index of the transparent medium. The device has the characteristics of high resolution ratio, high degree of linearity, direct digital output, simple structure, convenience for operation, fastness and the like. The device can also be used for monitoring the refractive index of the transparent medium in real time.

Description

technical field [0001] The invention relates to a method and device for measuring the refractive index of a transparent medium based on a Y-shaped cavity orthogonally polarized laser, and belongs to the technical field of laser measurement. Background technique [0002] The refractive index of a substance reflects a lot of information inside the substance, and is closely related to other parameters (such as density, pressure, etc.), so the measurement of the refractive index of a substance is widely used in many research fields. Usually the method of measuring the refractive index of transparent medium is to use the ellipsometer with mature technology (Sun Shunming, Zhang Liangying, Yao Xi. The principle of ellipsometry and its application in the characterization of functional thin films [J]. Piezoelectricity and Acousto-Optics, 1998, 20(3): 209-213) and the Abbe refractometer using the principle of total reflection (Hao Aihua, Gao Yingjun, Ruan Chi, etc. Automatically measu...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/21
Inventor 龙兴武肖光宗张斌
Owner NAT UNIV OF DEFENSE TECH
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