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All reflective apparatus for injecting excitation light and collecting in-elastically scattered light from a sample

By using a combination of off-axis reflectors and long-wavelength filters in inelastic spectroscopy, the problems of spectral purity and field of view collection in spectroscopy are solved, and the maintenance of spectral purity and the expansion of the field of view in spectroscopy are achieved. Improved signal collection efficiency and optimized device compactness.

Inactive Publication Date: 2012-05-09
C8 MEDISENSORS
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Problems solved by technology

Wheatley's device would require optical access to the second side of the sample, which is often impractical

Method used

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  • All reflective apparatus for injecting excitation light and collecting in-elastically scattered light from a sample
  • All reflective apparatus for injecting excitation light and collecting in-elastically scattered light from a sample
  • All reflective apparatus for injecting excitation light and collecting in-elastically scattered light from a sample

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Embodiment Construction

[0011] refer to Figure 1A , the radiation 15 that scatters the inelastic spectrum originates at point 10. After passing through optical window 20, radiation 15 is incident on off-axis reflector 30, which nominally collimates the light. The inelastic spectrum passes through the first LWP filter 40 and then through the second LWP filter 50 . Note that the LWP filters 40, 50 are arranged at an angle relative to the direction of propagation of the nominally collimated inelastic spectrum. The inelastic spectrum is then incident on the second off-axis reflector 60 , reflected by the plane mirror 70 and focused near point 80 .

[0012] refer to Figure 1B , the excitation beam 90 is incident on the LWP filter 40 and is reflected by the LWP filter 40 . The excitation beam 90 is then incident on the off-axis reflector 30 and focused through the window 20 . Excitation beam 90 does not have to be focused on Figure 1A , and generally can deviate from the location from which the in...

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Abstract

An apparatus is disclosed wherein laser radiation illuminates a sample using all reflective optics and wherein in-elastically scattered light from the sample is collected using the identical elements. The apparatus obviates the problem of contaminating the laser radiation with unwanted spectra from transmissive optics while providing very high rejection of the laser radiation with respect to the in-elastically scattered light. In addition, the apparatus can collect and launch light with high numerical aperture and large field of view.

Description

[0001] Cross References to Related Applications [0002] This application claims priority to U.S. Provisional Patent Application Serial No. 61 / 183,470, entitled "All Reflective Apparatus For Injecting Excitation Light And Collecting In-Elastically Scattered Light From A Sample," filed June 2, 2009, at This is incorporated by reference in its entirety. technical field [0003] The present invention generally relates to emitting and collecting light for inelastic spectroscopy. In particular, the present invention shows how to utilize total reflection optics to maintain the spectral purity of the emitted light while collecting light from the sample with a wide field of view, reusing the reflective optics and filters closest to the sample , a filter that both reflects emitted light and passes inelastically scattered light. Background technique [0004] In performing inelastic spectroscopy, a sample is illuminated with optical radiation in one wavelength band and the sample em...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/44
CPCG01J3/0208G01J2003/1247G01J2003/1226G01J3/021G01J3/4412G01J3/02
Inventor J·利普森D·A·艾斯
Owner C8 MEDISENSORS
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