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Highly-accelerated stress screening (HASS) method of anti-skidding brake control box of aircraft

A high-acceleration stress, anti-skid braking technology, applied in measuring devices, instruments, measuring electricity and other directions, can solve the problems of high missed detection rate, unreal data, hidden troubles, etc., to achieve the effect of ensuring reliability

Active Publication Date: 2013-08-14
XIAN AVIATION BRAKE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0019] In order to overcome the problems existing in the prior art or the high-accelerated stress screening test for general electronic products under non-working conditions, the obtained data is not true; or the low screening degree and high missed detection rate caused by ordinary screening methods And the screening time is long, or it is not suitable for determining the failure hidden dangers under the comprehensive environmental stress. The present invention proposes a method for high-acceleration stress screening of the aircraft anti-skid brake control box

Method used

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  • Highly-accelerated stress screening (HASS) method of anti-skidding brake control box of aircraft
  • Highly-accelerated stress screening (HASS) method of anti-skidding brake control box of aircraft
  • Highly-accelerated stress screening (HASS) method of anti-skidding brake control box of aircraft

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0053] The test of this embodiment uses a reliability enhancement test box model UHS1200, a digital multimeter, a signal source and an oscilloscope. The number of control boxes in this embodiment is 2 sets, one set is used to verify the validity of the test profile, and the other set is used to verify the safety of the test profile.

[0054] This implementation example includes the following steps.

[0055] Step 1, determine the low temperature working stress limit of the control box

[0056] When determining the low temperature working stress limit of the control box, the low temperature stress is applied to the control box step by step from 20°C to determine the low temperature working stress limit of the control box. The step size of applying low temperature stress is 2°C, and the cooling rate is -25°C / min. Each time the temperature reaches the specified value, keep it for 5 minutes. Allow time for the temperature balance of the control box, and then perform the performanc...

Embodiment 2

[0081] In this embodiment, a UHS1200 reliability strengthening test box, a digital multimeter, a signal source and an oscilloscope are used. The number of control boxes in this embodiment is 6 sets, 3 sets of which are used to verify the validity of the test profile, and the other 3 sets are used to verify the safety of the test profile.

[0082] This implementation example includes the following steps.

[0083] Step 1, determine the low temperature working stress limit of the control box

[0084] When determining the low temperature working stress limit of the control box, low temperature stress is applied to the control box step by step from 30°C to determine the low temperature working stress limit of the control box. The step size of applying low temperature stress is 5°C, and the cooling rate is -40°C / min. Each time the temperature reaches the specified value, keep it for 5 minutes. Allow time for the temperature balance of the control box, and then perform the performan...

Embodiment 3

[0109] In this embodiment, the high-acceleration stress screening test profile is determined for the third type of control box, and local design improvements have been completed for the problems in the low-temperature working stress limit test, high-temperature working stress limit test, and vibration working stress limit test of the control box. .

[0110] The test of this embodiment uses a reliability enhancement test box model UHS1200, a digital multimeter, a signal source and an oscilloscope. The number of control boxes in this embodiment is 10 sets, of which 5 sets are used to verify the validity of the test profile, and the other 5 sets are used to verify the safety of the test profile.

[0111] This implementation example includes the following steps.

[0112] Step 1, determine the low temperature working stress limit of the control box

[0113] When determining the low temperature working stress limit of the control box, the low temperature stress is applied to the c...

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Abstract

The invention discloses a highly-accelerated stress screening (HASS) method of an anti-skidding brake control box of an aircraft. By using the obtained working stress limit of low temperature, high temperature and vibration of the control box, an initial HASS test profile is established, and a high temperature quantity value, a low temperature quantity value and a vibration quantity value in the initial HASS test profile are lower than the working stress limit; and by using the characteristic that the high temperature quantity value, the low temperature quantity value and the vibration quantity value in the initial HASS test profile are lower than the working stress limit, an HASS test profile is obtained by validating the safety of failure hidden danger which exists in the control box. The method has the advantages that: by performing HASS test on the control box under the working state, a failure can be excited and observed, and the failure hidden danger of the control box can be discovered in a short time; according to test data, a certain defected control box is subjected to failure elimination, and screening time of 80 h is shortened into 2 h; and by tracking and observation,the failure of the control box is timely discovered and then timely eliminated, so that a safe and effective effect is achieved.

Description

technical field [0001] The invention relates to the field of electronic products of a landing gear control system of a transport aircraft, in particular to a high-acceleration stress screening test method for an aircraft anti-skid brake control box, and the performance is tested during the screening process. Background technique [0002] Highly accelerated life / highly accelerated stress screening (called HALT / HASS test method abroad) is a test technique to improve the quality of electronic product development and shorten the development time. Screening refers to installing the same batch of electronic products in the screening test equipment according to the conditions stipulated in the standard, and the faults in the test are allowed to be eliminated, and the electronic products without faults have passed the screening test and can be delivered to users. It can be divided into two types: conventional screening and high accelerated stress screening. The parameters of the hi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 乔建军田广来黄智商海东张谦刘忠平
Owner XIAN AVIATION BRAKE TECH
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