MCSKPCA based neural network fault diagnosis method for analog circuits

A technology for simulating circuit faults and neural networks, which is applied in the fields of neural networks and electronic circuit engineering, can solve problems such as complex fault models of simulated systems, long network training time, and slow progress, and achieve easy automatic processing, short training time, and simple calculations Effect

Active Publication Date: 2011-12-14
HUNAN UNIV
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Problems solved by technology

[0003] Since the testing and diagnosis of analog systems began to be studied in the 1960s, the progress has been relatively slow. The main reason is that the input excitation and output response of analog circuits are continuous quantities, and the parameters of each component in the network are usually continuous, that is, most faults The situation is a soft fault, so the fault model in the simulation system is more complicated, and it is difficult to make simple quantification
Since the fault parameters are also continuous, theoretically speaking, an analog component may have infinitely many faults, so testing and diagnosis are far more difficult than digital systems, so it is not yet fully mature in theory and methods, and can be paid There are few practical ones
[0004] In recent years, a lot of research has been done on the fault diagnosis of analog circuits from the system level, block

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  • MCSKPCA based neural network fault diagnosis method for analog circuits
  • MCSKPCA based neural network fault diagnosis method for analog circuits
  • MCSKPCA based neural network fault diagnosis method for analog circuits

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Embodiment Construction

[0057] The present invention will be described in detail below in conjunction with accompanying drawings and embodiments.

[0058] refer to figure 1 , the overall flow chart of the present invention is made of data collection step 1, wavelet transform step 2, wavelet approximation coefficient energy feature calculation step 3, feature extraction step 4 of MCSKPCA, data normalization processing step 5, and BP neural network classifier step 6. .

[0059] The data acquisition step 1 uses the data acquisition board to collect the voltage signal of the output node of the test circuit.

[0060] Wavelet transform step 2 is to use Haar wavelet to carry out wavelet transform on the collected voltage signal.

[0061] Let f(t) be the voltage output signal, ψ(t) be the Haar wavelet function, namely

[0062] The continuous Haar wavelet transform of f(t) is:

[0063] C ( a , b ) = ...

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Abstract

Disclosed is an MCSKPCA based neural network fault diagnosis method for analog circuits, comprising acquiring the output voltage signal of an analog circuit to be diagnosed; performing wavelet transformation on the acquired output voltage signal; calculating the energy eigenvalues of the wavelet coefficients of the output voltage signal, obtained through the wavelet transformation; performing MCSKPCA feature extraction and dimensionality reduction on the energy eigenvalues, and obtaining an optical eigenvector; and sending the optical eigenvector to a BP neural network separator, and outputting a fault diagnosis result by the BP neural network separator. The method can be used for not only diagnosis of linear or nonlinear circuits and systems thereof, but also diagnosis of hard fault and soft fault in the linear or nonlinear circuits.

Description

technical field [0001] The invention belongs to the field of neural network and electronic circuit engineering, and relates to a fault diagnosis method for an analog circuit based on a neural network. MCSKPCA is Maximal Class Separability KPCA, which is based on the maximum class separation kernel principal component analysis. Background technique [0002] In analog circuits, faults can be divided into two categories: one is called hard fault, which refers to the open circuit and short circuit failure of components; the other is called soft fault, which means that the parameters of components exceed the predetermined tolerance range, generally they None of the equipment completely fails, for example, due to the aging of components, deterioration or changes in the use of environment, etc. caused by changes in component parameters. [0003] Since the testing and diagnosis of analog systems began to be studied in the 1960s, the progress has been relatively slow. The main reaso...

Claims

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Application Information

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IPC IPC(8): G01R31/316G06N3/08
Inventor 何怡刚肖迎群方葛丰阳辉
Owner HUNAN UNIV
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