Small-size vibration-free quick temperature change test device

Abstract

The invention discloses a small-size vibration-free quick temperature change test device. The small-size vibration-free quick temperature change test device comprises a lower box body, an upper box body and a test cavity, wherein the lower box body comprises a lower heat insulation baffle plate, a lower semiconductor refrigerator fixing sleeve, a lower water-cooling boss, a lower supporting stud, a lower high-power semiconductor refrigerator, a lower double-stage semiconductor refrigerator, a lower heat insulation particle layer and a lower water pipe opening; and the upper box body comprises an upper heat insulation baffle plate, an upper semiconductor refrigerator fixing sleeve, an upper water-cooling boss, an upper supporting stud, an upper high-power semiconductor refrigerator, an upper double-stage semiconductor refrigerator, an upper heat insulation particle layer and an upper water pipe opening. The small-size vibration-free quick temperature change test device has good temperature control effect and is free from mechanical vibration; the heat insulation baffle plates are adopted between the box body and the cavity and used for sealing, and heat insulation material particles are filled between the box body and the cavity, so the small-size vibration-free quick temperature change test device can be used for heating and refrigerating; the temperature change rate is 30 DEG C per minute; the small-size vibration-free quick temperature change test device can be applied to the field of optical coherence detection, in particular high-precision temperature stress optical coherence detection systems for separating vibration interferences.

Description

Technical field [0001] The present invention involves temperature change test devices, especially a small type of miniaturization and rapid temperature change test device. Background technique [0002] In optical coherent testing, the tiny changes in the surrounding environment will have a great impact on the detection accuracy and even cause the test results errors. When evaluating the impact of hot impact stress on optical systems or components, the test environment must be ensured that the test environment is not subject to other stress factors.Impact, but the existing optical related detection system usually uses electrical system detection equipment, which introduces various external noise to affect the evaluation results. [0003] In order to solve this problem, the present invention uses non -vibrating semiconductor refrigerators as refrigeration units, multi -water channel water -cooled platforms as heat dissipation units, heat -thermal partitions seal, and insulation mat...

AI Technical Summary

Problems solved by technology

[0002] In optical coherent detection, small changes in the surrounding environment will have a great impact on the detection accuracy, and even cause errors in the detection results. When evaluating the impact of thermal shock stress on the optical system or components, it is necessary to ensure that the test environment is not affected by other stress factors. However, the existing optical coherent detection system usually uses the detection equipment of the electrical system, which introduces various external noises and affects the evaluation results

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