Method for testing and method for testing and controlling transmission chip

Abstract

The invention discloses a method for testing a transmission chip. The method comprises the following steps: test data sent to a chip to be tested is produced and constructed by programmable equipment in accordance with a test case; and the programmable equipment submits a test report according to the result that the chip to be tested processes and returns the test data. The invention further discloses a method for testing and controlling a transmission chip. Under the condition that an instrument is not depended on, the test data is constructed by the programmable equipment according to the test case; test result is returned to the programmable equipment, and the correctness of the result is judged by the programmable equipment, so that universal test on the chip is realized; by the adoption of the invention, the all-sided automatization of the test execution is realized through the control on test process, thereby improving the test efficiency and lowering the test cost.

Description

technical field [0001] The invention relates to testing technology, in particular to a testing method and a testing control method of a transmission chip. Background technique [0002] Verification and testing play an important role in chip development and have become an integral part of the development process. At present, the difficulties and problems in chip design, testing and manufacturing are gradually increasing, and some are becoming increasingly acute. With the continuous improvement of the performance and complexity of current chips, various defects that have never appeared before pose new challenges to traditional testing methods, and manufacturers need to formulate new testing strategies; at the same time, due to the continuous decline in the average price of integrated circuit devices, profits Rates are also declining, manufacturers must fully consider the test cost and economics. [0003] In the prior art, the test signal is generated by specific equipment an...

AI Technical Summary

Problems solved by technology

With the continuous improvement of the performance and complexity of current chips, various defects that have never appeared before pose new challenges to traditional testing methods, and manufacturers need to formulate new testing strategies; at the same time, due to the continuous decline in the average price of integrated circuit devices, profits rate is also declining, manufacturers must fully consider the test cost and economic

[0003] In the prior art, the test signal is generated by specific equipment and instruments, and the verification of the results often depends on the instrument, or is only converted into the signal required by the test chip through the programmable device. This test device has low versatility. One test device corresponds to one instrument, and only one chip can be tested, which results in increased test cost and poor test flexibility

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