Method for monitoring sensitive low-temperature surface pollution of spacecrafts

Abstract

The invention relates to a method for monitoring sensitive low-temperature surface pollution of spacecrafts, in particular to a method for monitoring sensitive low-temperature surface pollution of spacecrafts by utilizing a quartz crystal microbalance, belonging to the technical field of aerospace. The method is directly applied to monitoring surface pollution of infrared low-temperature remote sensors and other low-temperature space probes. The method is characterized by utilizing a liquid nitrogen refrigeration system and quartz wafers to simulate the sensitive low-temperature surfaces of the spacecrafts; lowering the surface temperature of the quartz crystal by the liquid nitrogen refrigeration system to ensure the quartz crystal to work under the worst temperature on the spacecraft orbit; heating non-metal materials or ensuring an engine to ignite to ensure the non-metal materials or the engine to effuse or jet pollutants; carrying out online in-situ monitoring on the frequency and temperature of the quartz crystal microbalance and storing the frequency and temperature; and closing a test system. The method is high in sensitivity (1.10*10<-9>-4.42*10<-9>), stable and reliable in test process, good in repeatability and suitable for large-scale test.

Description

technical field [0001] The invention relates to a method for monitoring the pollution of the sensitive low-temperature surface of a spacecraft, especially a method for monitoring the pollution of the low-temperature sensitive surface of a spacecraft by using a quartz crystal microbalance, which belongs to the field of aerospace technology and is directly applied to infrared low-temperature remote sensing and other aerospace low-temperature detectors Surface contamination monitoring. Background technique [0002] There are many sensitive components on the spacecraft (such as optical lenses, observation windows, solar cell covers, thermal control coatings, relay contacts, inner walls of waveguides, etc.) that require pollution monitoring and control. Although these sensitive surfaces have certain pollution control measures in the process of parts manufacturing, sub-system assembly, and final assembly, they may still suffer from varying degrees of pollution during spacecraft gr...

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to solve the problem that the deposition amount of non-metallic material outgassing or plume jet deposits on the low-temperature sensitive surface cannot be characterized in my country's existing spacecraft during the thermal vacuum test and on-orbit operation of the spacecraft. Method for bit-by-bit monitoring of non-metallic material outgassing pollutants or spacecraft plume pollutants on low-temperature sensitive surfaces of spacecraft

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