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Chip testing processor

A technology for testing processors and chips, which is applied in the direction of single semiconductor device testing, measuring electricity, measuring devices, etc., can solve the problems of unreasonable overall structure, unstable use performance, affecting use effect, etc., to achieve reasonable structure and stable use performance. , the use of good effect

Inactive Publication Date: 2010-07-07
JIAXING JINGYAN INTELLIGENT EQUIP TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the currently known test processors have defects such as unreasonable overall structure, inconvenient use, unstable performance, and affecting the use effect.

Method used

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  • Chip testing processor
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Embodiment Construction

[0031] The present invention will be described in detail below in conjunction with accompanying drawing: figure 1 , 2 As shown, the test handler 1 of the present invention includes a loading unit 2 (2A and 2B), a pre-positioning unit 3, a flat attitude detection unit 4, a picker unit 5, a test unit 6, and a precision indexing turntable unit 7 and Robot 8.

[0032] The loading unit 2 includes a tray loading unit 2A to be tested and a tray loading unit 2B for finished products, refer to image 3 and Figure 7 As shown, the loading unit 2A of the tray to be tested includes a tray box to be tested 2A1, a set of linear motion components, such as the embodiment, a stepper motor is connected to the screw rod through a coupling, or through a synchronous wheel synchronous belt drive Nut speed change mechanism, a push rod is fixed on the screw nut. When the stepping motor is running, the push rod will rise or fall in the vertical direction. Control the number of pulses of the steppin...

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Abstract

The invention discloses a chip testing processor, which mainly comprises: a load unit which comprises a detachable user tray material box for positioning the user tray that is provided with a to-be-tested chip; a pre-positioning unit which comprises a precise guide positioning plate and a vibration source generating vibration; a horizontal posture testing unit which comprises a set of high-precision sensors for testing whether the chip placed in a test fixture is located at a horizontal posture; a pickup unit which comprises a multi-head pickup device for picking-up the chip and a mechanical clamp for picking-up the tray; a testing unit which comprises the test fixture and a vertical elevating mechanism; a precision indexing turntable unit for accurately controlling station; a level multi-joint mechanical arm for serving as a four-freedom robot; the invention has characteristics of reasonable structure, convenient using, stable using performance, and good using effect.

Description

technical field [0001] The invention relates to a test processor for picking up chips to be tested from a user tray and loading them on a test machine for testing, and classifying the chips according to the test results. Background technique [0002] The test handler is a test screening equipment used for conveying, loading, testing and sorting semiconductor devices to be tested. It is an automatic test equipment that replaces manual testing, because it adopts precision processing technology, sensor detection technology, and intelligent control technology. , so that good test accuracy and operational stability can be obtained, which greatly eliminates the tedious process of manual testing and improves production efficiency. With the increasing variety of electronic consumption on the market, there are more and more various chips, so test processors with a higher degree of automation are increasingly favored. But presently known test handler has defects such as unreasonable ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/01G01R31/26
Inventor 朱玉萍岑刚
Owner JIAXING JINGYAN INTELLIGENT EQUIP TECH
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