Spectrometer based on X ray inspired light source

Abstract

The present invention relates to a spectrum test device used for material detection, and especially to a spectrometer based on X ray inspired light source. The spectrometer comprises an X ray generator, a vacuum channel, a limiting slit, a rotation sample table for placing the tested sample, an optical fiber, an incidence slit, a diffraction grating, an emergence slit, a concave mirror, a lens, a photomultiplier tube and a computer processing system. The X ray emitted from the X ray generator passes through a limiting slit of vacuum channel outlet and is irradiated to the tested sample on the rotation sample table. The inspired light of sample is transmitted to the incidence slit through the optical fiber, and is emitted out from the emergence slit after light splitting of diffraction grating. The inspired light is assembled to the photomultiplier tube after the concave mirror and lens. The photomultiplier tube is connected with the computer processing system through an A / D converter. The spectrometer of the invention settles a technical problem that the prior technical means can not realize the accurate and whole detection to the luminescent spectrum of luminescent material under the inspiration of X ray.

Description

technical field [0001] The invention relates to a spectroscopic testing instrument for material detection, in particular to a spectroscopic testing instrument suitable for testing luminescent materials under X-ray excitation. Background technique [0002] At present, the traditional fluorescence spectrometer basically uses a xenon lamp (150W) as the excitation light source, which can only be used for the detection of the emission spectrum of photoluminescent materials. However, those luminescent materials that must be excited by X-rays cannot be measured. To measure such materials, two instruments are usually used to measure them separately, that is, the materials are first excited on the X-ray instrument, and then immediately transferred to the fluorescence spectrometer. , Measure the spectral distribution curve and afterglow of its wavelength corresponding to the luminous intensity. [0003] Since the afterglow consists of two parts, it is a fast process in which the inst...

AI Technical Summary

Problems solved by technology

When the sample stops X-ray radiation and is moved to a fluorescence spectrometer for spectrometry, the change curve of the material’s luminescence with excitation time cannot be measured, and the measured wavelength corresponds to the luminous intensity of the luminous intensity spectral distribution curve. Significant decrease, and the measurement of the fast process of afterglow is incomplete, only the slow process can be measured

Therefore, it is impossible to accurately measure the afterglow curve with time and determine the afterglow time, so the spectral analysis of this material is an incomplete test result

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