Ceramic double arrange packaging device high accelerate centrifugation experiment cramping apparatus

Abstract

The fixture comprises a mother fixture, a daughter fixture used for placing the test piece, a fastening used for fastening the test piece and a fastening clamp plate. Said mother fixture has a through slot used for mounting the said daughter fixture by using a drawer way; on the side wall of the mother fixture there are screw type locking components.

Description

(1) Technical field [0001] The invention relates to a high-acceleration centrifugal test fixture for ceramic double-row packaged devices, which is suitable for high-acceleration (≥5000g) centrifugal test of ceramic double-row packaged (DIP) devices. (2) Background technology [0002] The integrated circuit centrifugal test is one of the indispensable test items for assessing the packaging of components, inner lead bonding, chip adhesion and mechanical strength. Ceramic dual-in-line package (DIP) devices are the most common package type in the component category. This category of devices includes three types of spans: small (7.62mm), medium (10.16mm), and large (15.24mm). The centrifugal test of this kind of device mainly adopts two methods: buried sand and clamp. [0003] The sand burying method is to put the test device into a metal box filled with quartz sand, and then put the metal box into the centrifuge ring rotor for testing. The advantage of this test method is that the te...

AI Technical Summary

Problems solved by technology

[0005] The special fixture provided by the manufacturer has the following disadvantages: 1) The fixture has poor versatility and is expensive; 2) Since the magnetic rubber or built-in rubber is generally used, the metal cover plate is prone to deformation and the ceramic device body is prone to deformation during high-acceleration centrifugal tests. Fracture, resulting in device failure; 3) Only one-way centrifugal test can be carried out, and multi-directional centrifugal test cannot be carried out

The utility model patent No. 99214208.3 introduces a fixture for centrifugal test devices, but it has the following disadvantages when applied to DIP devices: 1) Since there is no layered design on the force-bearing surface of the fixture, it is easy to cause metal cover plate depression and DIP device body Fracture; 2) When clamping the DIP device, the clamping is inconvenient, and it is difficult to position the device in the fixture; 3) Only one-way centrifugal test can be performed, and multi-directional centrifugal test cannot be performed

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