Analysing method for surface oxidation degree of bivalent Co and positive material utilization ratio
A technology of cobalt compounds and surface oxidation, which is applied in the direction of material analysis, analysis materials, and instruments using wave/particle radiation, can solve the problems of inability to accurately reflect the degree of oxidation of divalent cobalt compounds, high cost, and long experimental period. Fast, efficient method of production and procurement, easy to operate results
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Embodiment 1-7
[0025] Take the divalent cobalt compound samples S1, S2, S3, S4, S5, S6 and S7 described in Table 1 to carry out XPS test respectively, wherein the test conditions of XPS are as follows:
[0026] X-ray photoelectron spectrometer: the model PHI5800 X-ray photoelectron spectrometer produced by American PHI Company; the excitation source is monochromatic Al X-ray, the analysis area is a circle with a diameter of 800 microns, and the pass energy of the analyzer is 11.75 Volts with a step size of 0.05 eV. After obtaining the Co2p photoelectron peak, pollute C 1s = 284.8 electron volts as the standard to calibrate the charging effect, and then use the truncate method to deduct the background, and the obtained XPS spectra are shown in Figures 1-7. Then according to Fig. 1-7 and use the surface oxidation degree relational formula x%=(13-20y) / 13(y+1)*100% of divalent cobalt compound to calculate the surface oxidation degree of divalent cobalt compound, calculation result is as follows...
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