Creepage circuit breaker
A leakage circuit breaker and circuit technology, which is applied in the direction of circuit devices, emergency protection circuit devices, electrical components, etc., can solve the problems of insufficient Is level of the output circuit and hinder the normal operation of the leakage test function, and achieve easy design, reliability, and large size Amplification level, the effect of expanding the passband width
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no. 1 example
[0057] figure 1 and figure 2 A first embodiment of the invention is shown. figure 1 is a circuit diagram showing the main circuit configuration of the earth leakage circuit breaker according to the first embodiment of the present invention. figure 2 is shown included in the figure 1 Detailed circuit diagram of the active filtering circuit in the filtering and amplifying unit shown. To simplify the drawings, the Figure 7 The input resistors shown adjust the amplification level.
[0058] exist figure 2 In the circuit of the filtering and amplifying unit 10 having the operational amplifier 10a as an amplifying element, a multi-loop feedback type low-pass filter is formed. In this multi-loop feedback type low-pass filter, resistors R1 to R3 and capacitors C1 and C2 are added to the outside of the operational amplifier 10a as low-pass filter elements. Besides, on the side of the inverting input terminal of the operational amplifier 10a, a resistor R4, a capacitor C3, ...
no. 2 example
[0065] image 3 A detailed diagram of the active filtering circuit included in the filtering and amplifying unit according to the second embodiment of the present invention is shown in . This embodiment corresponds to requirement 3. In this embodiment, the circuit of the aforementioned first embodiment is further improved to enhance the product reliability of the earth leakage circuit breaker. In the improved circuit, the passband width of the band-pass filter is expanded to prevent the allowable value of the test frequency variation from being smaller than the target value, the above-mentioned variation being caused by the characteristic variation of the circuit element or the temperature variation. image 3 Two combinations are provided in the circuit configuration shown, each combination includes bandpass filter elements and as figure 2 Shown is the analog switch connecting the band-pass filter element and the low-pass filter element during the test. As described below,...
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