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Three dimension surface measuring method and device

A technology for three-dimensional surfaces and measuring devices, which can be applied to measuring devices, optical devices, instruments, etc., and can solve problems such as difficulty in practical use

Inactive Publication Date: 2005-03-02
INST OF COMPUTING TECH CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The key technology of the projected grating phase method lies in the phase unwrapping problem, which has not been completely solved yet, so it is difficult to be practical

Method used

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  • Three dimension surface measuring method and device
  • Three dimension surface measuring method and device
  • Three dimension surface measuring method and device

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Experimental program
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Embodiment Construction

[0032] figure 1 In the schematic diagram of , 1 is a projection device, 2 and 3 are imaging devices, 4 is an object, and 5 is an array of light spots projected on the surface of the object.

[0033] figure 2 In the structure of the light point projector, 6 is a laser point light source, 7 is a grating, and the grating has an array of light holes. The arrangement of the light-transmitting holes can be square or regular triangle.

[0034] image 3 In the arrangement of the light transmission holes, 8 is a square arrangement, and 9 is an equilateral triangle arrangement.

[0035] Figure 4 Among the three-dimensional surface measurement devices, 1 is a projection device, such as a light point projector, 2 and 3 are left and right cameras of an imaging device, 10 is a PC, and 11 is an object to be measured. The light emitted from the light source passes through the light holes on the grating to project a regular array of light spots on the surface of the object, and the two ...

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Abstract

The invention relates to substance measuring technical field especially a three-dimensional surface measuring method and apparatus, its method is described as follow: use projection apparatus to project regular lightspot array to surface of object, use more than two imaging devices in different positions to take photos of the and match light subpoint of the photo, by which compute three dimensional coordinate. It has the properties of intouching, high velocity, simple operation, low cost and can be widely used in industrial design and manufacture, production reversal inverted design and virtual reality.

Description

technical field [0001] The invention relates to the technical field of object measurement, in particular to a three-dimensional surface measurement method and device. Background technique [0002] The three-dimensional measurement technology of objects is widely used in industrial design and manufacturing, quality inspection and control, topographic measurement and exploration and other fields. In recent years, its application has also expanded to product imitation and reverse engineering, rapid prototyping, anthropometric and ergonomic design, film and television special effects, virtual reality and other fields. [0003] There are mainly two types of methods for 3D surface measurement, contact and non-contact. The main method of contact measurement is a three-coordinate measuring instrument, which has two types: mechanical and non-mechanical (such as optical probes). Its advantage is high measurement accuracy, but its disadvantages are slow measurement speed and high req...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00G01B11/03
Inventor 刘晖李华
Owner INST OF COMPUTING TECH CHINESE ACAD OF SCI
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