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Zoned split joint multiple He-Ne laser digital speckle interference measuring system

A technology of interferometry and digital speckle, applied in measuring devices, instruments, optical devices, etc., can solve the problems of low fringe contrast and low quality of measurement results, and achieve high fringe contrast, high coherence, and good quality

Inactive Publication Date: 2005-03-02
XI AN JIAOTONG UNIV
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  • Application Information

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Problems solved by technology

However, the coherence of semiconductor lasers and semiconductor-pumped solid-state lasers is much worse than that of He-Ne lasers, so this type of DSPI system has the disadvantages of low fringe contrast and low quality of measurement results

Method used

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  • Zoned split joint multiple He-Ne laser digital speckle interference measuring system
  • Zoned split joint multiple He-Ne laser digital speckle interference measuring system
  • Zoned split joint multiple He-Ne laser digital speckle interference measuring system

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Embodiment Construction

[0025] Such as figure 1 , figure 2 , image 3 , Figure 4 As shown, the multi-He-Ne laser digital speckle interferometry system of the present invention mainly includes: laser power supply 5, three low-power He-Ne lasers (6, 7, 8), optical switches (9, 10, 11 ), reference beam expander 12, laser beam splitter (13, 14, 15), total reflection mirror (16, 17, 18), object beam expander (19, 20, 21), imaging lens 23, half Transflective cube prism 24, CCD camera 25, image acquisition card 2, D / A conversion card 3, optical phase shifter 4, computer 1.

[0026] Accompanying drawing and the following description take three low-power He-Ne lasers DSPI measuring system as example to illustrate the embodiment of the present invention, but the present invention is not limited to three low-power He-Ne lasers, can be extended to have more low-power Measurement system for power He-Ne lasers.

[0027] figure 1 Shown in the system structural diagram of the present invention, among the fig...

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Abstract

The invention discloses a sectionalization concatenation multi-He-Ne laser maser digital speckle interference measuring system, comprising digital image processing control survey part which consists of computer, image acquisition card CCD camera, D / A conversion card and optical path part of laser light beam splitter, completely reflecting mirror, extending lens, optical phase shifting, referenced extending lens, imaging shot and semipermeable-semireflecting cubic mirror, whose characters are that several low power He-Ne laser maser with light switch on optical path of each one, different laser maser are used for illumination 8 different parts which are close to each other and have a little polymerization of substances tested in different times by controlling the light switch phase displacement measuring can be realized by using each low power He-Ne laser maser to illuminate separately, combining the measuring results by image concatenation algorithm to get complete information to be measured of large size object.The invention has increased measuring surface square by times and contrast of fringe obtained is high.

Description

technical field [0001] The invention belongs to the technical field of photoelectric detection, and relates to a new digital speckle interferometry system, in particular to a digital speckle interferometry system for measuring large-area objects by splicing multiple He-Ne lasers in partitions. Background technique [0002] DSPI-Digital Speckle Pattern Interfermetry (DSPI-Digital Speckle Pattern Interfermetry) is a comprehensive technology integrating laser, digital image processing, electronics and other disciplines. It can be used for deformation measurement, stress-strain analysis, non-destructive testing of composite materials and vibration mode measurement, etc., and has broad application prospects in the fields of machinery, aerospace and other fields. [0003] After searching, it is found that the existing DSPI measurement systems can be divided into two categories: [0004] One is to use a short-length inner-cavity He-Ne laser as a laser light source for illuminating...

Claims

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Application Information

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IPC IPC(8): G01B9/02G01B11/00
Inventor 贾书海
Owner XI AN JIAOTONG UNIV
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