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Machine vision inspection system and method having improved operations for increased precision inspection throughput

A technology of machine vision and inspection system, applied in the direction of instruments, image enhancement, measuring devices, etc., can solve problems such as insufficiency, and achieve the effect of avoiding time delay

Inactive Publication Date: 2004-12-01
MITUTOYO CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Thus, such inline systems have not addressed the specific throughput issues associated with providing precision imaging combined with precision motion control, and such systems are deficient in this regard

Method used

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  • Machine vision inspection system and method having improved operations for increased precision inspection throughput
  • Machine vision inspection system and method having improved operations for increased precision inspection throughput
  • Machine vision inspection system and method having improved operations for increased precision inspection throughput

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Embodiment Construction

[0036] figure 1 is a block diagram of an exemplary machine vision inspection system 10 in accordance with the present invention. Machine vision inspection system 10 includes vision measurement machine 12 operably connected to and exchanges data and control signals with control computer system 14 . Control computer system 14 is also operably connected to and exchanges data and control signals with monitor 16, printer 18, joystick 22, keyboard 24, and mouse 26. Vision measurement machine 12 includes a movable workpiece measurement stage 32 and an optical imaging system 34 that may include a zoom lens or interchangeable lenses. Zoom lenses or interchangeable lenses typically provide various magnifications for the images provided by imaging optical system 34 .

[0037] The joystick 22 can typically be used to control the movement of the movable workpiece measurement stage 32 in both the X and Y directions and the directional component of the movement of the movable optical imagi...

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PUM

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Abstract

A precision machine vision inspection system and method for increased inspection throughput. The vision inspection system includes a movable stage for scanning and measuring selected workpiece features. In prior systems, conventional interspersing of image processing and inspection operations with image acquisition operations required stopping and starting the stage motion during image acquisition, necessitating associated delays or wait-states in various operations. Such delays are avoided in this invention by acquiring images continuously, with a timing that is independent of image inspection operations, so that delays and wait-states are avoided. In addition, continuous stage motion is combined with a strobe lighting feature during the image acquisition operations to acquire blur-free images at a high rate. Improved image acquisition and image analysis routines including these features are created and stored by the system.

Description

technical field [0001] The present invention generally relates to a method for operating a machine vision inspection system with a camera and a measurement table movable relative to each other in multiple directions to scan and inspect selected features of a workpiece on the measurement table, and more In particular, the present invention relates to systems and methods for programming and executing image acquisition operations independent of image inspection operations, and systems for performing image acquisition operations by using continuous motion for improved precision machine vision inspection system throughput and methods. Background technique [0002] Precision machine vision inspection systems can be utilized to obtain precise spatial measurements of inspected objects and to inspect various other object characteristics. Such a system may include a computer, camera and optical system, a precision measurement table that is movable in multiple directions to allow the ...

Claims

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Application Information

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IPC IPC(8): G01B11/24G01N21/88G06T1/00G06T7/00
CPCG06T1/0007G01N2021/8835G01N2021/8838G06T2207/30164G01N2201/117G06T7/0004G01N2021/8887G01N2201/103G06T2207/30241G01N21/8806G01N2201/0694
Inventor 保罗·G·格拉德尼克理查德·M·沃瑟曼巴里·E·塞勒马克·L·德莱尼
Owner MITUTOYO CORP
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