Method and system for measruing object two-dimensiond surface outline
A technology of object surface and three-dimensional contour, applied in the direction of measuring device, 3D image processing, image data processing, etc., can solve the problems of difficult practical application and poor system operability
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[0093] A kind of three-dimensional measurement method proposed by the present invention and the embodiment of the system are described as follows:
[0094] The measurement system of this embodiment is as figure 1 shown. The system is composed of CCD cameras 1, 3, projector 2, computer 4 and so on.
[0095] The computer is PIII 1G with 1394 graphics card, and the graphics card supports dual monitor output.
[0096] The ASK C20+ high-definition digital projector used in the system has a brightness of 1500 ANSI lumens and a resolution of 800×600.
[0097] The CCD adopts the A302f digital camera of Germany Basler Company, its resolution reaches 780×582, conforms to the IEEE1394 industrial standard, and is used with the Computar M1214-MP fixed-focus lens. The steps taken by the method are as follows, wherein the implementation of the software is developed using the Visual C++6.0 platform:
[0098] 1) Use a computer to generate a virtual grating, including a coded grating and a ...
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