Automatic test system, device and method for ICs and overall system

Abstract

An automatic test system for testing integrated circuits (ICs) and overall system is composed of a rack, at least one computer for test purpose and arranged in said rack for carrying and testing an IC, at least one automatic connect / disconnect mechanism for plugging the IC to be tested in the testing computer or self-test computer and disconnecting it, and at least one controller for controlling the connection and disconnection of IC and its test process. After the ICs to be tested are plugged in the testing computer, it becomes a complete computer for running application and test programs and performing the test of overall system.

Description

Technical field [0001] The present invention relates to an automated integrated circuit complete machine testing system, device and method, and in particular to an automated integrated circuit complete machine testing system, device and method that can simulate the state of the end user and perform dynamic testing method. Background technique [0002] Computers have almost become one of the necessities in life for today’s humans, whether they are servers, workstations, desktop computers, notebook computers or portable computers ), or personal digital assistants, palm-topPCs, pocket PCs, or even industrial computers, have become part of most people’s daily lives. These computers are composed of many integrated circuits (ICs), and these integrated circuits must undergo complicated tests to ensure the quality of the products. [0003] Please refer to figure 1 , Is a well-known personal computer (PC) structure diagram. The well-known personal computer 100 mainly includes a central p...

AI Technical Summary

Problems solved by technology

[0008] The known integrated circuit test cannot simulate the final use state of the user, so even if it passes the test, there may be problems when the user uses it, such as conflicts with software, etc.

[0009] It is known that all the same components are placed on the test circuit board during the test of integrated circuits, and the compatibility problem between different components cannot be detected.

[0010] The known test methods still rely on a lot of labor, which limits the output and cost, and also causes the possibility of human error

[0011] The known test method for integrated circuit modules cannot control the operating temperature of the components after the integrated circuit is assembled, that is, at the module stage, so it is impossible to simulate and test certain conditions in actual use.

[0012] The judgment of known tests is generally based on the final state of the integrated circuit, and some dynamic errors cannot be detected, such as video shaking and discoloring display that occur when the program is actually executed by a graphics accelerator. ), ghost shallow or white block cannot be detected

Or crashes caused by integrated circuit software execution, etc., cannot be detected by traditional testing methods

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