Method for producing MEMS sensor suspension beam structure
A manufacturing method and sensor technology, applied in the direction of microstructure technology, microstructure devices, manufacturing microstructure devices, etc., can solve the problems of short release time, reduce the sensitivity of mechanical induction, etc., achieve regular geometry, shorten the length and the number of forks , the effect of reducing the volume
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0027] The present invention will be further described now in conjunction with accompanying drawing.
[0028] The manufacturing method steps of the MEMS sensor cantilever structure of the present invention are: preparing the first original silicon wafer 1 and the second original silicon wafer 5; adopting the repeated oxidation method on the first original silicon wafer 1 to form the oxide layer pattern 2 under the cantilever beam structure; Fabricate transition polysilicon layer 4; fabricate bonding sheet to form top layer silicon 5; release cantilever beam structure 6 by wet method.
[0029] 1. Prepare raw silicon wafers:
[0030] Using two double-sided polished first raw silicon wafers 1 and second raw silicon wafers 5, with a resistivity of 5-8Ω·cm, a crystal orientation, and a silicon wafer thickness of 400 μm;
[0031] 2. Form the oxide layer pattern 2 below the cantilever beam structure on the first original silicon wafer 1:
[0032] (1) At 900°C, 1 μm silicon dioxide...
PUM
Property | Measurement | Unit |
---|---|---|
electrical resistivity | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com