Universal analog-to-digital converter testing device

Abstract

The invention provides a universal analog-to-digital converter testing device, which at least comprises an analog-to-digital converter testing module, a plurality of testing interface boards, a testing mainboard, an external power supply, a signal generator and a logic analyzer, and is characterized in that the analog-to-digital converter testing module is sequentially connected to the testing interface boards and the testing mainboard; the external power supply, the signal generator and the logic analyzer are connected and are all connected to the analog-to-digital converter test module. The testing device can work in a modularized and independent mode and is high in expandability, different functions can be achieved only through a simple building block building mode, each component can operate independently and can be formed in a spliced mode when needed, the more spliced module assemblies are, the stronger the achieved functions are, operation is easy, maintainability is good, and the testing device is suitable for popularization and application. And the test problem of the analog-to-digital converter in practice can be well solved.

Description

technical field [0001] The invention belongs to the field of chip testing, in particular to a general analog-to-digital converter testing device. Background technique [0002] In order to be suitable for the evaluation of various types of analog-to-digital converters (ADC), such as Flash, SAR, Pipeline, Sigma Delta, etc., the general traditional test method is to use a general integrated automatic test system (ATE) test machine. Mainly for wafer (Wafer) testing, such as Teradyne, UltraFlex, Advantest, Agilent, although the architecture is common, the hardware is unified, but for high-precision high-speed ADC testing, its performance test is difficult to truly reflect the performance of IP, because the general machine The hardware is unified, in order to cover the test items used, the hardware needs to cover a wide range of test conditions, and its cost is very high. However, in some low-voltage, high-precision, high-speed tests, the parasitic parameters of the common test c...

AI Technical Summary

Problems solved by technology

[0002] In order to be suitable for the evaluation of various types of analog-to-digital converters (ADC), such as Flash, SAR, Pipeline, Sigma Delta, etc., the general traditional test method is to use a general-purpose integrated automatic test system (ATE) test machine, this machine Mainly for wafer (Wafer) testing, such as Teradyne, UltraFlex, Advantest, and Agilent, although the architecture is common and the hardware is unified, but for high-precision and high-speed ADC testing, its performance testing is difficult to truly reflect the performance of the IP, because the general-purpose machine The hardware is unified. In order to cover the test items used, the test conditions of the hardware need to cover a wide range, and the cost is very high.

However, in some low-voltage, high-precision, and high-speed tests, the parasitic parameters of the general-purpose test channel will affect the performance indicators. If you switch to advanced probes and hardware configurations, the cost is very expensive

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