Device and method for calibrating wavelength of X-ray spherical curved crystal spectrometer

Abstract

The invention discloses a device and a method for calibrating the wavelength of an X-ray spherical curved crystal spectrometer, the device comprises a vacuum chamber, and a bicrystal, a detector, a beryllium window and an X-ray source which are arranged in the vacuum chamber, the X-ray source comprises a titanium-X-ray source and a cadmium-X-ray source, and the X-ray source is arranged between the bicrystal and the beryllium window; the bicrystal is arranged at the bottom of the vacuum chamber, one side of the vacuum chamber is communicated with a first chamber, the detector is arranged on the side, away from the vacuum chamber, of the first chamber, and the detector and the bicrystal are oppositely arranged; the vacuum chamber is provided with a high-voltage feed-through for configuring a high-voltage loop; a movement mechanism is arranged on the vacuum chamber, the X-ray source is connected with the movement mechanism, and the movement mechanism is used for controlling movement of the X-ray source so that the center of the X-ray source and the center of the bicrystal can be located at the same horizontal height. According to the invention, the X-ray source is arranged in the vacuum chamber, so that the calibration source is ensured to be static, and the intensity of the calibration spectral line is prevented from being too weak.

Description

technical field [0001] The invention relates to the field of wavelength calibration of spherical curved crystal spectrometers used in tokamak devices, in particular to a device and method for wavelength calibration of X-ray spherical curved crystal spectrometers. Background technique [0002] X-ray spherical curved crystal spectrometer (abbreviated as curved crystal spectrometer) is one of the main diagnostics for measuring plasma ion temperature and rotational speed on tokamak devices. Its principle is mainly based on the Doppler translation of identified spectral lines. That is, the identification spectral line emitted by the plasma with a certain rotational speed will have a certain translation (Doppler translation) in wavelength relative to the spectral line emitted when it is stationary. This amount of translation is proportional to the component of the rotational speed in the direction of the line of sight. However, in order to obtain the absolute value of the plasma ...

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Problems solved by technology

[0006] The present invention provides a device and method for wavelength calibration of X-ray spherical curved crystal spectrometers, so as to solve the technical problems in the prior art that the wavelength calibration method of curved crystal spectrometers is not accurate enough or the spectral line intensity is too weak

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