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Chip-based failure analysis platform and chip type selection method

A failure analysis and platform technology, applied in data processing applications, complex mathematical operations, calculations, etc., can solve problems such as lack of resource sustainability, continuity, and inability to achieve resource sharing, and achieve the elimination of information islands and unified management. Effect

Pending Publication Date: 2022-07-22
CHONGQING CHANGAN AUTOMOBILE CO LTD
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  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to provide a chip-based failure platform and chip selection method to solve the technical problem: the current chip failure analysis platform presents the characteristics of fragmentation and fragmentation, which is mainly based on groups or individuals, and individual Resource sharing between individuals, between individuals and teams, and between groups lacks resource sustainability and continuity. With the rapid growth of resource information, how to achieve standardized and unified management of information, eliminate "information islands", and break the Information barriers and avoiding redundant construction have become an urgent problem to be solved

Method used

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  • Chip-based failure analysis platform and chip type selection method
  • Chip-based failure analysis platform and chip type selection method
  • Chip-based failure analysis platform and chip type selection method

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Embodiment Construction

[0063] The present invention will be further described below in conjunction with the accompanying drawings.

[0064] like figure 1 and figure 2 As shown, the present invention provides a chip-based failure analysis platform, including a platform access module, an information collection module, a platform management module, and a statistical analysis module.

[0065] The platform access module is used to judge whether the enterprises that want to enter the platform meet the access conditions. Based on the enterprise contribution of the enterprises that have entered the platform, they are given different levels of platform use rights. Among them, enterprises that have entered the platform can provide the platform Chip failure analysis cases to form a case library. The platform access module S101 includes access mode and enterprise authority. There are two ways for enterprises to join the platform. For leading enterprises or TOP100 enterprises, the platform actively invites th...

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Abstract

The invention relates to a chip-based failure analysis platform and a chip type selection method, and the platform comprises a platform admission module which is used for judging whether an enterprise who wants to enter the platform meets an admission condition or not, and giving different levels of platform use permissions to the enterprise based on the enterprise contribution degree of the enterprise who already enters the platform; the information acquisition module is used for acquiring chip failure analysis information through platform information acquisition or enterprise information release; the platform management module is used for auditing the invalid chip information and giving incentives to enterprises issuing false information based on punishment and evaluation enterprises; and the statistical analysis module is used for performing statistical analysis on the acquired information by utilizing a mathematical model to realize key information extraction. According to the method, various scattered failure analysis cases are effectively integrated, standardized and unified management of information is realized, 'information islands' are eliminated, information barriers are broken through, and a sharable knowledge platform is formed; the platform plays an important supporting role in chip type selection and chip failure rapid analysis.

Description

technical field [0001] The invention belongs to the technical field of chip database management and application, and particularly relates to a chip-based failure analysis platform and a chip selection method. Background technique [0002] Generally speaking, in the process of development, production, storage and use of chips, due to the influence of design, process technology, and various comprehensive environmental stresses such as high temperature, static electricity, and humidity, failure problems will inevitably occur. The causes of failure are complex and changeable, and the analysis is difficult, requiring a lot of manpower, material and financial resources. [0003] With the continuous improvement of people's requirements for product quality and reliability, failure analysis work is becoming more and more important. [0004] For car factories, the on-board chip is the core component of the network security and functional safety of the intelligent connected car. Its s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06F17/18
CPCG06Q10/0635G06Q10/06393G06F17/18
Inventor 吴海波关鹏辉谢先立李静艳娄晓康
Owner CHONGQING CHANGAN AUTOMOBILE CO LTD
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