Sample clamp and test method

A testing method and sample technology, applied in measuring devices, instruments, scientific instruments, etc., can solve the problems of easy falling off, low efficiency, long time consumption, etc., and achieve the effects of accurate testing results, stable and convenient analysis, and avoiding sample damage.

Pending Publication Date: 2022-07-15
INST OF RES OF IRON & STEEL JIANGSU PROVINCE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Therefore, the technical problem to be solved by the present invention is to overcome the defects of easy falling off, easy deformation, poor convenience, long time consumption and low efficiency in the installation and transfer process of the sample carrier (i.e. half-copper mesh) in the prior art, thereby providing a A sample fixture and test method

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] This example provides sample holders such as figure 1 As shown, it includes a base 1, the base 1 is provided with a groove 101, and the depth of the groove 101 is smaller than the height of the sample stage 4 to expose the bearing part of the sample stage 4; the guide structure 2 is detachably installed on the base 1 The guide structure 2 has a chute 201 communicated with the groove 101 and a support plate attached to one side of the base 1 . The chute 201 is suitable for guiding the sample carrier 4 to slide into the groove 101 under the action of gravity. The sample holder in this embodiment is a FIB-t-EBSD combined sample holder.

[0043] The sample stage 4 slides to the groove 101 through the chute 201 on the guide structure 2 , and the chute 201 makes the height of the sample stage 4 horizontal during installation to prevent the sample stage 4 from falling off and deforming during installation. The guide structure 2 is detachably installed, and the depth of the gr...

Embodiment 2

[0055] The present embodiment provides a combined testing method for FIB-t-EBSD, using the sample holder in Example 1, including the following steps:

[0056] 1. Place the sample stage 4 into the groove 101 of the base 1 through the chute 201 of the guide structure 2, specifically including:

[0057] After placing the sample stage 4 on the chute 201 of the horizontally arranged guide structure 2, the guide structure 2 is then tilted from a horizontal position to a position at an angle of 40-50° with the horizontal plane, in this embodiment, tilted to 45°, so that The sample stage 4 slides into the groove 101 along the chute 201 under the action of gravity. After the sample carrier 4 slides into the groove 101, the sample carrier 4 is fixed on the base by using the pressing block 301 and the fixing structure 3, such as image 3 shown.

[0058] Remove the guide structure 2 as in Figure 4 As shown, the sample holder assembled with the sample stage 4 is installed on the specia...

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Abstract

The invention provides a sample clamp and a test method, belongs to the technical field of test appliances, and overcomes the defects of easiness in falling, easiness in deformation, poor convenience, long time consumption and low efficiency in the mounting and transferring process of a sample carrying table in the prior art, so that the sample clamp and the test method are provided. The sample clamp comprises a base, the base is provided with a groove, and the depth of the groove is smaller than the height of a sample carrying table so that a bearing part of the sample carrying table can be exposed; the guide structure is detachably installed on the base, the guide structure is provided with a sliding groove and a supporting plate, the sliding groove is communicated with the groove, the supporting plate is attached to one side of the base, and the sliding groove is suitable for guiding the sample carrying table to slide into the groove under the action of gravity.

Description

technical field [0001] The invention belongs to the technical field of test utensils, and in particular relates to a sample fixture and a testing method. Background technique [0002] At present, the crystal orientation analysis of research materials mainly adopts three methods: (1) macroscopic statistical analysis using X-ray diffraction or neutron diffraction; (2) micro-domain crystal structure analysis using transmission electron microscopy (TEM) electron diffraction; (3) ) The crystal orientation analysis of the micro-domains was carried out using the electron backscatter diffraction (EBSD) technique in scanning electron microscopy (SEM). [0003] Traditional EBSD analysis is widely used due to the large analysis area and the large number of grains obtained, but it is limited by the signal excitation area, and its spatial resolution is low (>100 nm). Some researchers have tried to apply the transmission signal to the traditional EBSD technology, which is called trans...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20025G01N23/20008G01N23/203
CPCG01N23/20025G01N23/20008G01N23/203
Inventor 吴园园金传伟张继明
Owner INST OF RES OF IRON & STEEL JIANGSU PROVINCE
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