Method for generating reconstructed image

An image, image conversion technology, applied in the field of defect detection, can solve the problem of imperfect input image, sample reduction and so on

Pending Publication Date: 2022-06-07
INVENTEC PUDONG TECH CORPOARTION +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Furthermore, many input images are not perfect, and if these imperfect images are excluded, the available standard image samples will be greatly reduced

Method used

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Embodiment Construction

[0037] The detailed features and characteristics of the present invention are described in detail below in the embodiments, and the content is sufficient to enable any person skilled in the relevant art to understand the technical content of the present invention and implement it accordingly, and according to the content disclosed in this specification, the scope of the patent application and the drawings , any person skilled in the related art can easily understand the related concepts and features of the present invention. The following examples are used to further illustrate the point of the present invention in detail, but are not intended to limit the scope of the present invention in any point of view.

[0038] The present invention provides a method for generating a reconstructed image. The reconstructed image is generated by using the reconstruction model provided by an embodiment of the present invention and an input image. The input image is an image of a target obje...

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Abstract

The invention provides a method for generating a reconstructed image, which is suitable for an input image with a target object, and comprises the following steps: an encoder converts the input image into a feature map with a plurality of feature vectors; executing a training program according to a plurality of training images of a plurality of reference objects to generate a plurality of feature prototypes associated with the training images and storing the feature prototypes in a memory; selecting a part of the feature prototypes from a memory according to a plurality of similarities between the feature prototypes and the feature vectors; generating an approximate feature map according to the feature prototypes of the part and a plurality of weights, wherein the weights respectively represent the similarity between the feature prototypes and the feature vectors; and the decoder converts the approximate feature map into a reconstructed image. Wherein the encoder, the decoder and the memory form an auto-encoder. The defect classifier realized by applying the image reconstruction method provided by the invention can resist noise in a training data set.

Description

technical field [0001] The present invention relates to defect detection of image-based products, and more particularly, to a method for generating reconstructed images applied to the front-end of defect detection. Background technique [0002] For manufacturers, product appearance assessment is an essential step in quality assurance. Undetected defects such as scratches, bumps and discoloration will increase the cost of returning the product to the factory for repair and loss of customer confidence. Most visual inspection jobs today are still performed by humans because of the difficulty in describing various defects using traditional computer vision algorithms in Automatic Optical Inspection (AOI) machines. However, managing human inspectors has its administrative challenges as it is difficult to maintain consistent inspection standards across different product lines. [0003] Object detector networks have been proposed in the past to solve the above problems. However, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T11/00G06T7/00G06T7/11G06T5/00G06V10/46G06V10/74G06K9/62
CPCG06T11/00G06T7/0002G06T7/11G06T5/002G06T2207/10004G06T2207/20081G06F18/22G06T7/0004G06T2207/20084G06T2207/30108G06V10/82G06V10/993G06T1/0014G06V10/443G06F18/214
Inventor 陈文柏陈怡君陈佩君陈维超
Owner INVENTEC PUDONG TECH CORPOARTION
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