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Software defect information acquisition method and device, equipment and storage medium

A technology of software defects and tested software, applied in the field of artificial intelligence, can solve problems such as different manual operation habits, misunderstanding of developers, and interference of developers

Pending Publication Date: 2022-05-17
ONE CONNECT SMART TECH CO LTD SHENZHEN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The defect of the related technology is that the manual operation habits of each tester are different, and the format of the manually collected and recorded defect information is difficult to unify
Defect information in various formats may interfere with developers, leading to misunderstandings and increasing communication costs
Moreover, manual collection and recording of defect information used to describe defects in detail takes up a lot of time in the software testing process, resulting in high time and labor costs in the software testing process and low software testing efficiency.

Method used

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  • Software defect information acquisition method and device, equipment and storage medium
  • Software defect information acquisition method and device, equipment and storage medium
  • Software defect information acquisition method and device, equipment and storage medium

Examples

Experimental program
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Embodiment 1

[0030] figure 1 It is a flowchart of a method for acquiring software defect information provided by Embodiment 1 of the present invention. The embodiment of the present invention is applicable to the situation of obtaining software defect information during the software testing process. The method can be executed by the software defect information obtaining device provided in the embodiment of the present invention. The device can be implemented in the form of software and / or hardware, and Generally can be integrated in computer equipment.

[0031] Such as figure 1 As shown, the method of the embodiment of the present invention specifically includes:

[0032] Step 101, sending a test start instruction to the software under test, so that the software under test obtains a preset test instruction package corresponding to the software under test from a storage module of the computer device according to the test start instruction, and executes them sequentially Various test inst...

Embodiment 2

[0064] figure 2 It is a flow chart of a method for acquiring software defect information provided by Embodiment 2 of the present invention. The embodiment of the present invention may be combined with each optional solution in the foregoing one or more embodiments. Such as figure 2 As shown, the method of the embodiment of the present invention specifically includes:

[0065] Step 201, sending a test start instruction to the software under test, so that the software under test obtains a preset test instruction package corresponding to the software under test from a storage module of the computer device according to the test start instruction, and executes them sequentially Various test instructions in the preset test instruction package.

[0066] Step 202 , during the process of the software under test sequentially executing the various test instructions, displaying a floating control corresponding to the software under test on a display page of the software under test. ...

Embodiment 3

[0077] image 3 It is a schematic structural diagram of an apparatus for acquiring software defect information provided by Embodiment 3 of the present invention. Such as image 3 As shown, the device includes: a start command sending module 301 , a control display module 302 , an information acquiring module 303 and an information sending module 304 .

[0078] Wherein, the start instruction sending module 301 is configured to send a test start instruction to the software under test, so that the software under test obtains a prediction corresponding to the software under test from a storage module of the computer device according to the test start instruction. A test instruction package is set to sequentially execute various test instructions in the preset test instruction package; a control display module 302 is used to display the various test instructions in the software under test during the process of sequentially executing the various test instructions of the software un...

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Abstract

The invention relates to the field of artificial intelligence. The embodiment of the invention discloses a software defect information acquisition method and device, equipment and a storage medium. The method comprises the steps that a test starting instruction is sent to tested software, so that the tested software executes various test instructions in sequence according to the test starting instruction; displaying a suspension control corresponding to the tested software on a display page of the tested software; if it is detected that the test user clicks the suspension control, a defect reproduction instruction is sent to the tested software, so that the tested software re-executes at least one target test instruction executed at the current moment according to the defect reproduction instruction, a target software development kit embedded into the tested software in advance is called, and software defect information is collected and fed back; and sending the software defect information to terminal equipment of a development user. According to the embodiment of the invention, the format uniformity of the software defect information can be ensured, a software development kit can be used for replacing repeated manual operation of a test user, and the software test efficiency is improved.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of artificial intelligence, and in particular, to a method, device, device, and storage medium for acquiring software defect information. Background technique [0002] In the process of software testing, the acquisition of software defect information is often involved. After finding the defect of the software under test, the tester obtains defect information describing the defect in detail, and sends the defect information to the developer, so that the developer can better locate the defect of the software under test and solve the defect of the software under test. In related technologies, after a tester finds a defect in the software under test, he manually collects and records defect information for describing the defect in detail. [0003] The defect of the related technology is that each tester has different manual operation habits, and it is difficult to unify the format of manual...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F3/04817
CPCG06F11/3688G06F11/3692G06F3/04817
Inventor 凌玲
Owner ONE CONNECT SMART TECH CO LTD SHENZHEN
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