Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Three-dimensional measurement system and phase error compensation method

A technology of phase error and compensation method, which is applied in the field of three-dimensional measurement, can solve problems such as large influence, and achieve the effect of improving measurement accuracy, ensuring reliability, ensuring reliability and effectiveness

Pending Publication Date: 2022-04-12
HEFEI UNIV OF TECH
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the phase error caused by the gamma effect of the projector in the above-mentioned prior art, the problem that the small-step phase shift, especially the 3 or 4-step phase shift method, is greatly affected by the gamma effect, the present invention proposes a three-dimensional measurement Systematic and Phase Error Compensation Methods

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Three-dimensional measurement system and phase error compensation method
  • Three-dimensional measurement system and phase error compensation method
  • Three-dimensional measurement system and phase error compensation method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0057] In this embodiment, the image correction model is set as:

[0058] I'=I γ (1)

[0059] Among them, γ represents the pre-compensation value; I represents the light intensity I according to the setting during the projection process of the phase shift method c The light intensity of the projected image obtained, I=I c λ , λ represents the gamma coefficient; I' represents the phase shift method according to the set value I during the projection process c light intensity after compensation The obtained light intensity of the projected image, that is, the value after I is compensated. I γ Indicates the γ power of I, means I c The γ power, I=I c λ means I c λ power of .

[0060] That is, combined with the projector gamma distortion model:

[0061] I=I c λ ; (2)

[0062] Have:

[0063] Denote the real phase corresponding to the image captured by the camera as φ 0 , denote the phase of the image captured by the camera as φ, and denote the phase of the imag...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a three-dimensional measurement system and a phase error compensation method, and the method comprises the steps: carrying out the phase compensation of a small-step phase shift method projection image through combining an optimal compensation factor and a set image correction model, and obtaining an actual projection image after the compensation of the small-step phase shift method; the projection image refers to a fringe pattern projected and output by a projector; the projection step number of the small-step phase shift method is smaller than or equal to 5. The optimal compensation factor is calculated according to the phase error difference between the small-step phase shift method projection image and the expected projection image of the target object, so that light intensity compensation is performed on the projection image obtained by the small-step phase shift method according to the optimal compensation factor, then the phase is calculated according to the compensated projection image, phase correction of the projection image is realized, and the accuracy of the phase correction is improved. The measurement precision is improved.

Description

technical field [0001] The invention relates to the field of three-dimensional measurement, in particular to a three-dimensional measurement system and a phase error compensation method. Background technique [0002] We live in a three-dimensional world, and effective collection, analysis and processing of three-dimensional information can help people understand things more accurately. However, the perception of things by the visual system based on the human eye is easily affected by various internal and external factors. In order to solve this problem, many measurement tools have been developed. Among them, the three-dimensional measurement system (PSP system for short) using phase shift profilometry (Phase Shiftimg ProfiloMetry, PSP system) has become a three-dimensional shape measurement system due to its easy implementation, low cost and high flexibility. One of the most effective techniques for appearance measurement. However, the projector and camera in the PSP syste...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/24
Inventor 卢荣胜王彦晓蔡晓旭
Owner HEFEI UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com