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Self-detection analog-to-digital converter bit error rate test method and test system

A technology of bit error rate testing and analog-to-digital converters, applied in the direction of analog/digital conversion calibration/testing, etc., can solve the problems of long bit error rate test cycle and large uncertainty, so as to reduce bit error errors and improve phase quality Noise characteristics, the effect of ensuring safety

Pending Publication Date: 2022-04-01
BEIJING MXTRONICS CORP +1
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  • Claims
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AI Technical Summary

Problems solved by technology

[0004] The technical problem solved by the present invention is to provide a self-detection analog-to-digital converter bit error rate testing method and testing system for the problem of long test period and large uncertainty of the bit error rate, which can detect the bit error rate of the analog-to-digital converter Detect power supply voltage at the same time, high test efficiency, safe and reliable

Method used

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  • Self-detection analog-to-digital converter bit error rate test method and test system

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Embodiment Construction

[0039] Below in conjunction with accompanying drawing and specific example the present invention is described in further detail:

[0040] See attached figure 1 , a self-detection analog-to-digital converter bit error rate testing system, the system includes a signal source, a clock source, a power analyzer, a configuration module, a UPS operation monitoring module, an acquisition operation module, a test evaluation board, an industrial computer, and a display module; The analog-to-digital converter chip to be tested is loaded on the test evaluation board;

[0041] The signal source is used to generate the measured analog signal and output it to the analog-to-digital converter chip to be tested;

[0042] A clock source is used to provide a sampling clock signal for the analog-to-digital converter chip to be tested;

[0043] The power analyzer is used to provide power signals for the analog-to-digital converter chip to be tested and other devices on the test evaluation board; ...

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Abstract

The invention relates to a self-detection analog-to-digital converter bit error rate test method and test system. The system adopts a power supply analyzer to provide power supply signals for an analog-to-digital converter chip to be tested and other devices; the industrial personal computer writes the configuration instruction of the to-be-tested analog-to-digital converter chip into the to-be-tested analog-to-digital converter chip through a configuration module according to a configuration time sequence required by the to-be-tested analog-to-digital converter chip; the UPS operation monitoring module monitors the voltage of each power supply of the analog-to-digital converter chip to be tested on the test evaluation board, and feeds back power supply'invalid 'state information to the industrial personal computer if the jitter of any power supply voltage is greater than a preset threshold value; otherwise, feeding back the effective state information of the power supply to the industrial personal computer; and the industrial personal computer is used for carrying out error rate statistics according to the data uploaded by the acquisition operation module when the power supply is in an effective state, otherwise, discarding the data uploaded by the acquisition operation module, and stopping the error rate test until the total data volume participating in the error rate statistics meets the requirement or the error rate exceeds a threshold value.

Description

technical field [0001] The invention relates to a self-detection analog-to-digital converter bit error rate testing method and a testing system, which are designed for the long test cycle of the bit error rate of the analog-to-digital converter and many uncertain factors, and belong to the technical field of the analog-to-digital converter. Background technique [0002] In many practical application fields, it is required that the analog-to-digital converter does not allow high conversion errors. Such applications as measurement equipment, life system health monitoring, radar and electronic warfare, etc., need to complete the precise monitoring of extremely weak signals, transient signals and instantaneous signals, and false triggering may cause accidents or even system failures. Therefore, it becomes very important to be able to accurately quantify the conversion bit error rate of the analog-to-digital converter. [0003] However, the bit error rate test often takes a long...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
Inventor 王川中张铁良谭博张鑫星秦坤李宁李东亢郑子岳
Owner BEIJING MXTRONICS CORP
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