Self-detection analog-to-digital converter bit error rate test method and test system
A technology of bit error rate testing and analog-to-digital converters, applied in the direction of analog/digital conversion calibration/testing, etc., can solve the problems of long bit error rate test cycle and large uncertainty, so as to reduce bit error errors and improve phase quality Noise characteristics, the effect of ensuring safety
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[0039] Below in conjunction with accompanying drawing and specific example the present invention is described in further detail:
[0040] See attached figure 1 , a self-detection analog-to-digital converter bit error rate testing system, the system includes a signal source, a clock source, a power analyzer, a configuration module, a UPS operation monitoring module, an acquisition operation module, a test evaluation board, an industrial computer, and a display module; The analog-to-digital converter chip to be tested is loaded on the test evaluation board;
[0041] The signal source is used to generate the measured analog signal and output it to the analog-to-digital converter chip to be tested;
[0042] A clock source is used to provide a sampling clock signal for the analog-to-digital converter chip to be tested;
[0043] The power analyzer is used to provide power signals for the analog-to-digital converter chip to be tested and other devices on the test evaluation board; ...
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