Laser chip aging test system and method

Abstract

The invention provides a laser chip aging test system and method. The system comprises an aging test module which is provided with a plurality of chips to be tested, an optical fiber transmission module comprising a plurality of optical fibers, a light receiving test module and a control and processing module; each optical fiber corresponds to one to-be-tested chip, the first end of each optical fiber is arranged at the light emitting position of the corresponding to-be-tested chip so as to collect the laser emitted by the to-be-tested chip, and the second end of each optical fiber outputs the laser; the light receiving test module is used for collecting and testing the laser output by the optical fiber transmission module; and the control and processing module is connected with the aging test module and the light receiving test module, and is used for analyzing the measurement data output by the light receiving test module to obtain the aging test data of the chip to be tested, and controlling the light receiving test module to collect the laser output by each optical fiber in the optical fiber transmission module according to the aging test data. Therefore, decoupling of the aging test and the optical test in space can be realized, and the system design is effectively simplified.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a laser chip aging testing system and method. Background technique [0002] Long-term stability and service life are one of the key performances of high-power semiconductor laser chips. The aging test method is usually used in the industry to test and judge, that is, to continuously inject current into the packaged semiconductor laser chip through special testing equipment to make it Continue to work, and evaluate the relevant performance of chip products by monitoring, testing, and analyzing parameters such as the output power and wavelength of the chip during the work process. [0003] In the current conventional aging test scheme, the optical test equipment must be integrated with the aging main system in a single cabinet or a fixed area, and the requirements for matching the spatial positions of the two are relatively high, making the system design difficult. Contents ...

AI Technical Summary

Problems solved by technology

[0003] In the current conventional aging test scheme, the optical test equipment must be integrated with the aging main system in a single cabinet or a fixed area, and the requirements for the matching of the two spatial positions are relatively high, and the system design is difficult

Images