Electronic information science and technology test platform

Abstract

The invention discloses an electronic information science and technology test platform which comprises a bearing table, a lifting assembly is arranged in the bearing table, and the lifting end of the lifting assembly is connected with a sealing box; a plurality of sealing cavities are evenly formed in the sealing box, sealing doors are hinged to ports of the sealing cavities, sliding plates are arranged in the sealing cavities in a sliding mode, testing instruments are arranged on the surfaces of the sliding plates, elastic telescopic pieces are arranged at the bottoms of the sealing cavities, and the telescopic ends of the elastic telescopic pieces are connected with the bottom faces of the sliding plates. Connecting rod assemblies are hinged between the bottom faces of the sliding plates and the inner walls of the sealing doors. The platform has the advantages that a test instrument can be effectively protected, and the test instrument is prevented from being damaged under the action of external force; the sealing cavities can be opened and automatically sealed, corresponding testing instruments can be selected and used conveniently, and the operation is easy and convenient; the automatic power connection and automatic power off of the test instrument can be realized, damage to the test instrument caused by forgetting power off is avoided, and the use effect is good.

Description

Technical field [0001] The present invention relates to the technical field of test platforms, and specific to an electronic information science and technology test platform. Background technique [0002] Electronic Information Science and Technology enables one of the important classifications of electronic information classes, mainly designs computer, information technology applications and other directions. During the teaching and working experiment of electronic information science and technology, electronic devices such as circuits need to be tested, which requires the test platform. However, during the current test platform, you need to select the test instrument you need to use according to the test item, and perform the handling and arrangement of the test instrument. In the handling arrangement, the test instrument cannot be effectively protected, it is easy to cause test instruments. Damage; At the same time, in the process of use, it is necessary to manually carry out ...

AI Technical Summary

Problems solved by technology

However, during the use of the current test platform, it is necessary to select the test instruments to be used according to the test items, and carry out the handling and arrangement of the test instruments. During the handling, arrangement and use, the test instruments cannot be effectively protected, which may easily cause the test instruments to be damaged. At the same time, in the process of use, it is necessary to manually connect and disconnect the power. It is easy to cause damage to the test instrument because of a mistake and forget to power off, and the use effect is not ideal.

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