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Circuit self-checking method, circuit and chip

A circuit and transmission path technology, applied in the circuit self-test method, circuit and chip field, can solve the problems of high power consumption, high cost, and difficulty in implementation, and achieve the effect of easy implementation, cost saving and power consumption

Pending Publication Date: 2022-01-25
NATIONZ TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is: in the prior art, the environmental monitoring circuit self-inspection method has high cost, high power consumption and difficult to realize. Aiming at this technical problem, a circuit self-inspection method, circuit and chip are provided

Method used

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  • Circuit self-checking method, circuit and chip
  • Circuit self-checking method, circuit and chip
  • Circuit self-checking method, circuit and chip

Examples

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Effect test

no. 1 example

[0048] In order to solve the problems in the prior art that the environmental monitoring circuit self-inspection method is costly, consumes a lot of power and is difficult to implement, this embodiment provides a circuit, please refer to figure 1 As shown, the circuit includes: a sensing module 10 , and a processing module 20 connected to the sensing module 10 .

[0049] Wherein, the sensing module 10 is used to detect the environmental parameters and send them to the processing module 20 . It should be noted that the sensing module 10 can be a device such as a sensor that can detect environmental parameters, wherein the type and number of sensors can be flexibly set according to actual needs, for example, it can be a temperature sensor that can detect temperature, a sensor that can detect laser, Sensors that can detect electromagnetic fields, sensors that can detect voltage, etc. For example, if temperature and laser need to be monitored, a temperature sensor and a sensor ca...

no. 2 example

[0077] In order to better understand the present invention, this embodiment is described with a more specific example. see Figure 8 as shown, Figure 8 The circuit structure diagram provided for the second embodiment of the present invention, the circuit includes: a sensing module 10, a comparison module 22, an alarm control module 23, a main processor 24, a storage module 21, a first detection module 401 and a second detection module 402 .

[0078] Wherein, the perception module 10 is connected with the comparison module 22, the comparison module 22 is connected with the storage module 21 and the alarm control module 23, the alarm control module 23 is connected with the main processor 24, the main processor 24 is connected with the storage module 21, the first detection module 401 And the second detection module 402 is connected.

[0079] The sensing module 10 is used to detect environmental parameters and send the detected environmental parameters to the comparison modul...

no. 3 example

[0096] On the basis of the first embodiment and the second embodiment, this embodiment provides a circuit self-inspection method. The circuit includes a sensing module 10 and a processing module 20 connected to the sensing module 10 .

[0097] Wherein, the sensing module 10 is used to detect the environmental parameters and send them to the processing module 20 . It should be noted that the sensing module 10 can be a device such as a sensor that can detect environmental parameters, wherein the type and number of sensors can be flexibly set according to actual needs, for example, it can be a temperature sensor that can detect temperature, a sensor that can detect laser, Sensors that can detect electromagnetic fields, sensors that can detect voltage, etc. For example, if temperature and laser need to be monitored, a temperature sensor and a sensor capable of detecting laser can be provided.

[0098] The processing module 20 is configured to compare the environmental parameter d...

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Abstract

The invention discloses a circuit self-checking method, a circuit and a chip, and aims to solve the problems of high cost and large power consumption of an environment monitoring circuit self-checking mode in the prior art, the circuit provided by the invention comprises a sensing module and a processing module connected with the sensing module; the sensing module is used for detecting environment parameters and sending the environment parameters to the processing module; the processing module is used for comparing the environmental parameters detected by the sensing module with a threshold value and generating an alarm signal when the environmental parameters detected by the sensing module exceed the threshold value; the processing module is further used for setting the threshold value as a self-checking threshold value in a self-checking state, judging whether the circuit is normal or not according to whether an alarm signal exists or not. If the alarm signal exists, the circuit is normal, if the alarm signal does not exist, the circuit is abnormal, and the self-checking threshold value is a value except an environment parameter value which can be detected by the sensing module; therefore, the self-inspection of the circuit is realized without increasing the number of sensors of the same type, and the cost and the power consumption are saved.

Description

technical field [0001] The invention relates to the field of circuit safety, and more specifically relates to a circuit self-inspection method, a circuit and a chip. Background technique [0002] In the prior art, in order to ensure that the external environment is suitable for circuit operation, or to avoid interfering with circuit operation by changing the external environment to ensure circuit safety, an environmental monitoring circuit is usually set up to monitor the external environment through sensors, and when the external environment is abnormal, Sound the alarm. For example, the security of chips is currently a more concerned issue, and there are many attack methods against chips, for example, fault injection attacks and so on. Among them, the fault injection attack refers to the attack method that interferes with the operation of the chip by external means such as laser, electromagnetic radiation or voltage interference, and uses the fault state or wrong operatio...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2843G01R31/2849
Inventor 王宇建杨威吴永强徐基明
Owner NATIONZ TECH INC
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