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Flat field correction parameter acquisition method and device

A flat-field correction and acquisition method technology, applied in the field of image processing, can solve problems such as the mosaic effect of the output image, achieve high computational efficiency and reduce the amount of data

Pending Publication Date: 2021-12-17
BEIJING LUSTER LIGHTTECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] This application provides a method and device for obtaining flat-field correction parameters to solve the problem in the prior art that using multiple pixels to share a set of flat-field correction parameters can reduce the need to store flat-field correction parameters in the calibration process to a certain extent (FPN and PRNU) data volume, but the flat-field correction parameters obtained by the calibration process will cause the mosaic effect in the output image after flat-field correction of the image to be corrected

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  • Flat field correction parameter acquisition method and device

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Embodiment 1

[0092] see figure 1 , the application provides a method for obtaining flat-field correction parameters, comprising the following steps:

[0093] S101. Acquire a dark field image of the image to be corrected, wherein the dark field image is composed of at least one dark field pixel block, and each of the dark field pixel blocks contains at least one dark field pixel point;

[0094] S102. Calculate and store the dark field row mean vector and the dark field column mean vector of the dark field image;

[0095] S103. Call the stored dark field row mean value vector to calculate a dark field row mean value matrix;

[0096] S104. Call the stored dark field column mean value vector to calculate and obtain a dark field column mean value matrix;

[0097] S105. Add the dark field row average matrix and the dark field column average matrix to obtain the FPN parameter of each dark field pixel in the dark field image;

[0098] S106, acquiring the PRNU parameter of each bright field pixe...

Embodiment 2

[0130] see figure 2 , the present application provides a method for obtaining flat-field correction parameters, comprising the following steps:

[0131] S201, acquiring the FPN parameter of each dark field pixel in the dark field image of the image to be corrected;

[0132] S202. Acquire a bright-field image of the image to be corrected, wherein the bright-field image is composed of several bright-field pixel blocks, and each of the bright-field pixel blocks contains several bright-field pixel points;

[0133] S203. Calculate and store the bright field row mean vector and the bright field column mean vector of the bright field image;

[0134] S204, call the stored bright field row mean value vector, and calculate the bright field row mean value matrix;

[0135] S205. Call the stored bright field column mean value vector to calculate the bright field column mean value matrix;

[0136] S206. Multiply the bright field row average matrix and the bright field column average mat...

Embodiment 3

[0168] Embodiment 3: the method of embodiment 1 and embodiment 2 is combined

[0169] When there is no default value for the flat-field correction parameter, that is, both flat-field correction parameters need to be calculated, then the calculation of the FPN parameter in Embodiment 1 and the calculation of the PRNU parameter in Embodiment 2 can be combined to obtain the flat-field correction parameter. Through calculation, the dark field row average matrix of the image to be corrected in the calibration process with a resolution of N*M is an N*M matrix, the dark field column average matrix is ​​an N*M matrix, and the PRNU row parameter is the bright field row The mean matrix is ​​an N*1 matrix, and the PRNU column parameters, that is, the bright field column mean matrix is ​​a 1*M matrix. When storing parameter data during the calibration process, it is only necessary to store and calculate the dark field row mean matrix and dark field column mean matrix. The required dark fi...

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Abstract

The invention provides a flat field correction parameter acquisition method and device. The method comprises the following steps: acquiring a dark field image of a to-be-corrected image; calculating and storing a dark field row mean vector and a dark field column mean vector; calling the stored dark field row mean vector, and calculating a dark field row mean matrix; calling the stored dark field column mean vector, and calculating a dark field column mean matrix; adding the dark field row mean value matrix and the dark field column mean value matrix to obtain an FPN parameter of each dark field pixel point; obtaining a PRNU parameter of each bright field pixel point in the bright field image of the to-be-corrected image; and outputting the FPN parameter and the PRNU parameter as a flat field correction parameter of each to-be-corrected pixel point in the to-be-corrected image. According to the method, only the row mean vector and the column mean vector of the to-be-corrected image need to be stored, the parameter data size needing to be stored during flat-field correction is reduced, and the flat-field correction parameters with the same data size after flat-field correction parameter calculation is carried out on pixel points in the to-be-corrected image one by one can be obtained.

Description

technical field [0001] The present application relates to the technical field of image processing, and in particular to a method and device for obtaining flat-field correction parameters. Background technique [0002] In the field of image processing, in order to solve the inconsistency of the image sensor in the camera itself, the brightness non-uniformity introduced by the light source and the lens, etc., flat-field correction is generally used to process the image collected by the camera. Flat-field correction (FFC) is a correction method for brightness correction based on the linear response of the image sensor in the camera, and the uniformity of camera imaging can be improved through flat-field correction. Flat-field correction parameters are required for flat-field correction. Calculating flat-field correction parameters usually requires collecting a dark-field image Dark_Img and a bright-field image Bright_Img with 80% brightness, and then using the collected images ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00G06T7/80
CPCG06T7/80G06T2207/10004G06T5/90
Inventor 郭慧张见戚涛姚毅杨艺
Owner BEIJING LUSTER LIGHTTECH
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