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Test method, system and device and storage medium

A test method and test type technology, applied in the computer field, can solve the problems of high test server pressure, large hardware investment, and low test efficiency, and achieve the effect of improving test flexibility, reducing hardware investment, and improving convenience

Pending Publication Date: 2021-12-17
SHENZHEN TETRAS AI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] It is not difficult to find that such a test system has the defects of cumbersome structure due to the two-level topology, large hardware investment, low test efficiency, and high pressure on the test server.

Method used

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  • Test method, system and device and storage medium
  • Test method, system and device and storage medium
  • Test method, system and device and storage medium

Examples

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Embodiment Construction

[0050] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with this application. Rather, they are merely examples of devices and methods consistent with aspects of the present application as recited in the appended claims.

[0051] The terminology used in this application is for the purpose of describing particular embodiments only, and is not intended to limit the application. As used in this application and the appended claims, the singular forms "a", "the", and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. It should also be understood that the term "an...

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Abstract

The invention provides a test method, system and device and a storage medium. The method can be applied to a test server. The test server side is connected with a message queue telemetry transmission (MQTT) server side, and the MQTT server side is wirelessly connected with a plurality of terminals. The method comprises the following steps: acquiring attribute information of a to-be-tested program and a to-be-tested terminal; calling the MQTT server side, sending the to-be-tested program and the attribute information to the multiple terminals, wherein the multiple terminals are used for judging whether the terminals are the to-be-tested terminals or not according to the attribute information and executing a test task based on the to-be-tested program under the condition that the terminals are determined to be the to-be-tested terminals. Therefore, intermediate PC hardware is not needed, a test system is simplified, and hardware investment is reduced. Through the low-power-consumption IOT protocol, the resource consumption of the test server side can be reduced, asynchronous information transmission is achieved through MQ, the high-concurrency pressure of the test server side is relieved, and the test efficiency is improved.

Description

technical field [0001] The present application relates to the field of computer technology, in particular to a testing method, system, equipment and storage medium. Background technique [0002] After the program development is completed, the program needs to be deployed on multiple terminals (for example, mobile phones) for testing. The testing may include functional testing, compatibility testing, stability testing and the like. [0003] The test system currently employed consists of a two-level topology. Wherein the first-level topology: multiple PCs (personnelcomputers, personal computers) are respectively used as information transfer nodes, and are connected to multiple terminals through wired connections; the second-level topology: connect the multiple terminals to the test server. [0004] In the test system, the test server can send program test tasks (including information such as programs to be tested) to multiple terminals through multiple PCs to complete the te...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F11/26G06N3/02G06N3/08
CPCG06F11/2273G06F11/26G06N3/02G06N3/08
Inventor 李宏铭常全福奚磊
Owner SHENZHEN TETRAS AI TECH CO LTD
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