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Film uniformity detection system based on double-path full projection light

A technology of thin film uniformity and detection system, which is applied in the direction of optical instrument testing, optical performance testing, machine/structural component testing, etc. It can solve the problem of thin film image with many isolated noise points, difficult long-term observation, and affecting film uniformity discrimination issues of accuracy

Pending Publication Date: 2021-11-09
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI +1
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Traditional detection is generally realized by visual inspection and simple measurement by experienced inspectors. The detection results lack reliability and accuracy, cannot be quantitatively evaluated, and are difficult to conduct long-term observations
For transparent films, such as polyester films, there are many isolated noise points in the collected film image, which seriously affects the subsequent processing of the image, which in turn affects the accuracy of film uniformity discrimination

Method used

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  • Film uniformity detection system based on double-path full projection light
  • Film uniformity detection system based on double-path full projection light
  • Film uniformity detection system based on double-path full projection light

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Embodiment Construction

[0028] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0029] see figure 1 , the embodiment of the present invention includes:

[0030] A film uniformity detection system based on two-way full projection light, including an imaging unit, an acquisition unit, a processing unit, a storage unit, a control unit, a display unit, and an execution unit.

[0031] combine figure 2 , the imaging unit is used to generate P polarized light for uniform illumination, including a light source, a P polarizer, a filter, a collimator, a uniform mirror and a condenser lens arranged in sequence, the centers of which are all located on the same axis, uniform The light mirror is located at the focal point of the conden...

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Abstract

The invention discloses a thin film uniformity detection system based on double-path full projection light. The thin film uniformity detection system comprises an imaging unit, an acquisition unit, a processing unit, a storage unit and a control unit, wherein the imaging unit is used for generating P polarized light for uniform illumination and comprises an upper surface imaging unit and a lower surface imaging unit which are located on the upper surface and the lower surface of the transparent film respectively, and the P polarized light is incident to the upper surface and the lower surface of the transparent film at the same Brewster angle to achieve double-path total transmission; the acquisition unit comprises an objective table and a plurality of line-scan digital cameras, and is used for acquiring the film image and carrying out multi-camera calibration; and the processing unit is used for identifying the thin film image by adopting a preset thin film uniformity detection model and detecting whether the thin film image is distorted so as to realize thin film uniformity consistency judgment. The uniformity of the upper and lower surfaces and the interior of the transparent film can be detected.

Description

technical field [0001] The invention relates to the technical field of film uniformity detection, in particular to a film uniformity detection system based on two-way full projection light. Background technique [0002] Thin films are widely used in LCD TVs, tablet computers, smart phones, car display screens and other fields. Limited by the production process or production environment, the film is prone to quality defects during the production process, mainly manifested in uneven thickness and scratches on the surface. There are traces, internal bubbles, or impurities, dust, etc. inside the film. Therefore, film uniformity testing has become an important part of the quality control of film materials. [0003] Traditional detection is generally carried out by experienced inspectors through visual inspection and simple measurement. The detection results lack reliability and accuracy, cannot be quantitatively evaluated, and are difficult to conduct long-term observations. For...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/0278
Inventor 董俊马冬何俊明马凡徐盼盼姜铭坤黄小文
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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