Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Broadband Microwave Circuit with Low Insertion Loss and Flat Negative Group Delay

A technology of insertion loss and negative group delay, applied in the direction of circuits, waveguides, electrical components, etc., can solve the problem of large attenuation, and achieve the effect of small insertion loss and small fluctuation of group delay

Active Publication Date: 2022-07-08
DALIAN MARITIME UNIVERSITY
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although these circuits can achieve flat negative group delay characteristics, but the attenuation is relatively large

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Broadband Microwave Circuit with Low Insertion Loss and Flat Negative Group Delay
  • A Broadband Microwave Circuit with Low Insertion Loss and Flat Negative Group Delay
  • A Broadband Microwave Circuit with Low Insertion Loss and Flat Negative Group Delay

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0059] In this embodiment, a broadband microwave circuit with low insertion loss and flat negative group delay characteristics is enumerated, and the case where the center operating frequency is 2.14 GHz is described.

[0060] like figure 2 As shown, the group delay value of the broadband microwave circuit with low insertion loss and flat negative group delay characteristic of the present invention is -1ns at the center frequency of 2.14GHz, and within the frequency range of 2.041GHz to 2.239GHz, the group delay value is -1 ns. The delays are all negative values; in the frequency range of 2.074GHz to 2.207GHz, the fluctuation of the group delay is ±1%, realizing the broadband flat negative group delay characteristic.

[0061] like image 3 Experiments show that at 2.14GHz, the signal attenuation of the broadband microwave circuit with low insertion loss and flat negative group delay characteristics of the present invention is less than 10dB, and the return loss of the input ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a broadband microwave circuit with low insertion loss and flat negative group delay characteristics, comprising: an input port, a microstrip line, a parallel branch and an output port. Wherein, the microstrip line includes the input microstrip line, the connecting microstrip line and the output microstrip line sequentially connected from left to right; the parallel branch includes the first parallel branch and the second parallel branch with the same structure and size; the first parallel branch Branches include short-circuit transmission lines, open-circuit transmission lines, series transmission lines, absorption resistors, half-wavelength transmission lines and quarter-wavelength transmission lines; the broadband microwave circuit provided by the present invention can realize broadband flat negative group delay characteristics, and has relatively low insertion loss. It has the advantages of small, small group delay fluctuation and good matching of input and output ports. The technical scheme of the invention solves the problems of excessive insertion loss, poor matching performance of input and output ports, and large fluctuation of group delay value within the negative group delay bandwidth.

Description

technical field [0001] The present invention relates to microwave circuits, in particular, to a broadband microwave circuit with low insertion loss and flat negative group delay characteristics. Background technique [0002] At present, the negative group delay circuit has attracted more and more attention of scholars and has been used in many circuits, such as combining with amplifiers to enhance efficiency, compensating for beam squint of series-fed antenna arrays, as non-Foster components, and with Other circuit elements are cascaded to equalize the group delay of the system, etc. [0003] Due to the wide application prospects of negative group delay circuits, in recent years, in order to obtain high-performance negative group delay circuits, scholars have proposed many new technologies, such as signal interference technology, filtering theory technology and lossless transmission line loading resistance, based on methods such as lossy transmission lines or distributed am...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01P3/08
CPCH01P3/081H01P3/08
Inventor 孟雨薇王钟葆韩鹏刘宏梅傅世强房少军
Owner DALIAN MARITIME UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com