System and method for directly capturing particles by using optical tweezers under high vacuum condition

Abstract

The invention discloses a system and a method for directly capturing particles by using optical tweezers under a high vacuum condition. The system comprises a vacuum cavity, micro-nano particles, a supporting device, an optical tweezers device and a detection feedback device, the micro-nano particles are attached to the supporting device, the supporting device attached with the micro-nano particles is arranged in the vacuum cavity, and the optical tweezers device is in optical path connection with the detection feedback device; the optical tweezers device generates capture light and is used for capturing micro-nano particles in an optical trap capture region in the vacuum cavity; and the detection feedback device generates cooling light which is used for cooling and consuming mass center motion energy of the micro-nano particles so as to stabilize the micro-nano particles. The method is used for stably capturing the micro-nano particles by the system. By means of feedback cooling, micro-nano particles can be directly captured by the optical tweezers under the high-vacuum condition.

Description

technical field [0001] The invention relates to a system and method for capturing particles with optical tweezers under vacuum conditions in the field of precision measurement technology, and in particular to a system and method for directly capturing particles with optical tweezers under high vacuum conditions. Background technique [0002] Vacuum optical tweezers are a technical means that can be applied to precision sensing and fundamental physics exploration. It can be used to measure extremely weak mechanical quantities, including force, acceleration, moment, etc. It can also be used to explore fundamental physics issues such as macroscopic quantum effects, non-Newtonian gravity, and Casimir force. Since the suspended micro-nano particles in the vacuum optical tweezers system have no mechanical contact with the external environment, the environmental noise can be well isolated, thereby achieving high measurement accuracy. [0003] In order to achieve the measurement a...

AI Technical Summary

Problems solved by technology

[0004] However, the existing technical means rely on the high probability of random collisions between gas molecules and micro-nano particles under low vacuum, so that the energy of the center-of-mass motion of the micro-nano particles can be dissipated and can be easily trapped by optical tweezers.

However, the probability of random collisions between gas molecules and micro-nano particles is very low under high vacuum, so the existing technology cannot achieve particle capture under high vacuum conditions.

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