Intelligent debugging device for 12-bit serial ADC (Analog to Digital Converter)

Abstract

The invention discloses an intelligent debugging device for a 12-bit serial ADC (Analog to Digital Converter), and the device comprises a fixed seat, a first electric push rod, a stepping motor, a second electric push rod, an arm tube, a charging and sucking pump, a fixed disc, a first visual sensor, a detection frame, a connection frame, a detection disc, and a second visual sensor, firstly a first electric push rod, a stepping motor and a second electric push rod are matched with each other, the height, the angle and the length can be adjusted, then multi-position and multi-angle control of the arm tube is achieved, the purpose of good electric and intelligent operation is achieved, visual detection can be conducted on the top face of the 12-bit serial ADC through the first visual sensor and the second visual sensor, the washing and sucking pump is matched to adsorb the 12-bit serial ADC on the lower portion, grabbing is achieved, and meanwhile after the 12-bit serial ADC is grabbed, visual scanning detection can be finally conducted on the bottom face of the 12-bit serial ADC through the effect of the second visual sensor.

Description

technical field [0001] The invention relates to the technical field of analog-to-digital conversion, in particular to an intelligent debugging device for a 12-bit serial ADC. Background technique [0002] Analog-to-digital converter (ADC) is a very important link in modern measurement and control, and it is generally divided into serial analog-to-digital converter and parallel analog-to-digital converter. Although the latter has a fast transmission speed, it has many pins, is large in size, and takes up more MCU ports; while the serial ADC can also achieve a high transmission rate, and has the advantages of small size, low power consumption, and less Occupancy of MCU ports, etc. advantage. Therefore, the application of serial ADC is more and more extensive. [0003] According to the above, the testing methods for 12bit serial ADCs in the prior art have many defects and deficiencies due to the lack of intelligent equipment, as follows; [0004] 1. It is impossible to reali...

AI Technical Summary

Problems solved by technology

[0004] 1. It is impossible to realize electrification and intelligence, which affects the test efficiency and is not conducive to large-scale application

[0005] 2. It is impossible to realize the detection and drive control of 12bit serial ADC based on vision technology

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